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Edge time reading circuit

A technology of time readout and delay circuit, which is applied in the direction of transforming continuous pulse chains into pulse chain devices with required modes, etc. It can solve the problem of high single-frame acquisition time, limited application, and failure to meet the requirements of acquisition frame rate, etc. question

Active Publication Date: 2013-03-06
MICROARRAY MICROELECTRONICS CORP LTD
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  • Abstract
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AI Technical Summary

Problems solved by technology

This readout circuit has the advantages of low noise and miniaturization, but the long readout time limits its application in array sensors
This is due to the fact that under the serial readout architecture, the single frame acquisition time of the time array sensor is about 2 orders of magnitude higher than that of the level array sensor, which can neither meet the image synchronization requirements nor meet the acquisition requirements of most application systems. frame rate requirements

Method used

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Embodiment Construction

[0015] Such as figure 1 As shown, the edge time readout circuit provided by the present invention includes an analog-to-digital conversion module (1), an "edge-pulse" conversion module (2), a time series generation module (3), a snapshot module (4) and a reading module (5); also includes analog edge signal port (0), parameter configuration port (6), address input port (7), read data output port (8); analog edge signal port (0) to analog-to-digital conversion module ( 1) Provide input; the analog-to-digital conversion module (1) provides input to the "edge-pulse" conversion module (2); the parameter configuration port (6) provides input to the time series generation module (3); the "edge-pulse" conversion module (2) and the time series generation module (3) provide input for the snapshot module (4); the address input port (7) provides input for the reading module (5); the reading module (5) controls the snapshot module (4) and read; the read module (5) outputs to the read data...

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Abstract

The invention provides an edge time reading circuit. Some sensors carry output information by time quantum, and particularly by generation time of an analog edge. Unit sensing time is long, so that when sensor arrays are arranged in groups, time cost of reading out a serial line is high. The edge time reading circuit disclosed by the invention comprises an analog-to-digital conversion module, an edge-pulse conversion module, a time sequence generation module, a snapshot module and a reading module, and can be used for reading analog edge generation time quantum in parallel and converting data read in parallel into serial output, thereby providing an important technology for grouping of the sensors with a time quantum output manner.

Description

technical field [0001] The invention relates to a sensor readout circuit, in particular to a sensor readout circuit whose output is edge generation time. Background technique [0002] The sensor circuit usually converts the target physical quantity into a level quantity or a time quantity for measurement, and then inversely transforms the measurement result based on the conversion equation of the sensor circuit to realize the indirect measurement of the target physical quantity. In large-scale grouped array sensors, due to the necessity of serial output, most of them adopt the group structure of parallel acquisition and serial readout. The average readout time of each unit multiplied by the number of units is the lower bound of the frame acquisition time. . The readout time of each unit in the time measurement method is much longer than the readout time of each unit in the level measurement method, resulting in almost all existing array sensors adopting the level measuremen...

Claims

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Application Information

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IPC IPC(8): H03K5/156
Inventor 不公告发明人
Owner MICROARRAY MICROELECTRONICS CORP LTD
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