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A kind of LED performance test box, calibration method and performance test method

A calibration method and a technology of a test box, which are applied in the direction of testing optical properties and single semiconductor device testing, etc., can solve the problems of increasing manpower and time costs, affecting test results, and changing the performance of test samples to achieve good applicability, simple operation, The effect of reducing the working life

Active Publication Date: 2015-09-23
RESEARCH INSTITUTE OF TSINGHUA UNIVERSITY IN SHENZHEN
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  • Application Information

AI Technical Summary

Problems solved by technology

[0004] 1. During the whole test process, it is necessary to repeatedly install and disassemble the LED samples, which increases a lot of manpower and time costs;
[0005] 2. In the process of installation and disassembly, there are unstable factors that cause the performance of the test sample to change and affect the final test result

Method used

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  • A kind of LED performance test box, calibration method and performance test method
  • A kind of LED performance test box, calibration method and performance test method
  • A kind of LED performance test box, calibration method and performance test method

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Embodiment Construction

[0029] Specific embodiments of the present invention will be further described below in conjunction with the accompanying drawings.

[0030] Such as figure 1 and 2 As shown, an embodiment of the LED performance test box includes a box body 1, a motor 11, a first light-picking device 13, a second light-picking device 131, a rotating shaft 16, and a connector 17. The box body 1 is provided with a connecting box The through hole 12 of the inner cavity 19 of the external body and the box body, the rotating shaft 16 passes through the through hole 12, the first light picking device 13 and the second light picking device 131 are arranged in the inner cavity 19 of the box body 1, and the motor 11 is arranged in the box body Outside the body 1, the motor 11 can drive the rotating shaft 16 to rotate, and one end of the rotating shaft 16 extending into the inner cavity 19 is fixed to the connecting piece 17, and the first light picking device 13 and the second light picking device 131 ...

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Abstract

The invention discloses an LED (Light Emitting Diode) performance test box, a calibrating method and a performance test method. The test box comprises a box body, a motor, a first light taking device and a second light taking device, and also comprises a rotating shaft, optical fibers and a connecting piece, wherein the box body is provided with a through hole, and the rotating shaft and the optical fibers pass through the through hole; the first light taking device and the second light taking device are arranged inside the box body, and the motor is arranged outside the box body; the motor drives the rotating shaft to rotate; the first light taking device and the second light taking device are fixed on the rotating shaft through the connecting piece; the motor drives the first light taking device and the second light taking device to move at the respective circumferences; and the first light taking device and the second light taking device transfer collected light to the outside of the box body through the optical fibers. The LED performance test box is simple in structure, and easy and simple to operate, and can detect LED performance parameters on line.

Description

technical field [0001] The invention relates to the field of LED testing, in particular to an LED performance testing box, a calibration method and a performance testing method. Background technique [0002] The currently prevailing LED reliability test method is: in the same model and batch of LED products, a certain number of samples are selected for testing, and their performance parameters are measured before and during the test, and calculated according to the corresponding lifetime algorithm. Model, LED life of the batch. Since the theoretical life of LEDs is tens of thousands of hours, it is necessary to use an intensive test method with enhanced stress to speed up the entire test process. [0003] In order to improve efficiency and optimize test results, it is common practice to conduct reliability tests on multiple LED samples at the same time. In the existing LED reliability test system, a tray is usually sampled, multiple LED samples are fixed on the tray, and t...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01M11/02G01R31/26
Inventor 胡益民刘岩敬刚张志甜杨永刚朱惠忠张超刘文斌李永光曹广忠汤皎宁高文杰袁文龙梁荣陆兆隆
Owner RESEARCH INSTITUTE OF TSINGHUA UNIVERSITY IN SHENZHEN
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