Check patentability & draft patents in minutes with Patsnap Eureka AI!

System capable of achieving digital signal processor (DSP) single-plate or multi-plate joint test action group (JTAG) debugging and debugging method

A single-board and inter-board technology, which is applied to systems and debugging fields that can realize DSP single-board or multi-board JTAG debugging, can solve problems such as joint debugging of multi-board and multi-DSP systems, and achieve high reliability, convenient use, and prevent The effect of misuse

Inactive Publication Date: 2013-03-27
CSIC WUHAN LINCOM ELECTRONICS
View PDF7 Cites 25 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0015] The technical problem to be solved by the present invention is to provide a system and a debugging method that can realize JTAG debugging of a DSP single board or a multi-board in view of the defect that the multi-board multi-DSP system cannot be jointly debugged in the prior art

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • System capable of achieving digital signal processor (DSP) single-plate or multi-plate joint test action group (JTAG) debugging and debugging method
  • System capable of achieving digital signal processor (DSP) single-plate or multi-plate joint test action group (JTAG) debugging and debugging method
  • System capable of achieving digital signal processor (DSP) single-plate or multi-plate joint test action group (JTAG) debugging and debugging method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0046] In order to make the objectives, technical solutions, and advantages of the present invention clearer, the following further describes the present invention in detail with reference to the accompanying drawings and embodiments. It should be understood that the specific embodiments described here are only used to explain the present invention, but not to limit the present invention.

[0047] The embodiment of the present invention can realize a DSP single-board or multi-board JTAG debugging system, including multiple DSP boards, such as figure 2 As shown, it includes board A, board B, and board C, where each DSP board includes four DSP chips, such as S0, S1, S2, and S3 on board A.

[0048] Such as figure 2 with image 3 As shown, the DSP board includes multiple DSP chips connected in series in a daisy-chain manner; the DSP board is equipped with an input JTAG interface (JTAGIN) and an output JTAG interface (JTAGOUT), and a connection between the input JTAG interface and the ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a system capable of achieving digital signal processor (DSP) single-plate or multi-plate joint test action group (JTAG) debugging and a debugging method. The system is provided with a plurality of DSP plates. The DSP plates are provided with input JTAG interfaces, output JTAG interfaces and off-on control circuits connected between the input JTAG interfaces and the output JTAG interfaces, wherein the input JTAG interfaces and the output JTAG interfaces are arranged on the DSP plates. A first one of series-connection DSP chips on the DSP plates is connected with the input JTAG interfaces, and a last one of the series-connection DSP chips on the DSP plates is connected with the output JTAG interfaces. During single-plate debugging, the input JTAG interface of one DSP plate is directly connected with a simulator. During multi-plate debugging, the plurality of DSP plates are connected through JTAG interconnection cables. The JTAG interconnection cables are connected between the DSP plates so as to switch to a multi-plate debugging mode automatically, the JTAG interconnection cables are removed so as to switch to a single-plate mode, and the system is convenient to use. Through hard wiring between the plates, the system and the debugging method can avoid misoperation of users and have high reliability.

Description

Technical field [0001] The invention relates to a DSP debugging method based on the JTAG standard, in particular to a system and a debugging method that can realize the JTAG debugging of a DSP single board or multiple boards. Background technique [0002] At present, in the debugging process of DSP (Digital Signal Processing) system, using JTAG (Joint Test Action Group) for DSP hardware function debugging and software algorithm verification is the current mainstream debugging method. JTAG boundary scan adopts the IEEE1149.1 standard, which defines the hardware structure and working mechanism of using JTAG. Its advantage is that it transforms complex circuit board testing into a good structure, which can be handled simply and flexibly by software. [0003] The working principle of JTAG can be summed up as: define a TAP (Test Access Port) inside the device, and test and debug the internal nodes through a dedicated JTAG test tool. The basic idea is to add a shift register unit on th...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01R31/3177
Inventor 薛永辉袁浩许霄龙
Owner CSIC WUHAN LINCOM ELECTRONICS
Features
  • R&D
  • Intellectual Property
  • Life Sciences
  • Materials
  • Tech Scout
Why Patsnap Eureka
  • Unparalleled Data Quality
  • Higher Quality Content
  • 60% Fewer Hallucinations
Social media
Patsnap Eureka Blog
Learn More