Particle beam irradiation system and correction method for charged particle beam
A technology of charged particle beam and irradiation system, applied in the directions of X-ray/γ-ray/particle irradiation therapy, radiotherapy, irradiation device, etc., can solve problems such as unfavorable beam utilization efficiency, beam exhaustion, and reduced irradiation dose consistency. , to achieve the effect of improving beam utilization efficiency
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Embodiment 1
[0046] use figure 1 , figure 2 as well as image 3 A particle beam irradiation system as a preferred embodiment of the present invention will be described. The particle beam irradiation system 1 of the present embodiment is as figure 1 As shown, an ion beam generating device 11, a beam transporting device 14, and an irradiation field forming device (charged particle beam irradiation device, hereinafter referred to as an irradiation device) 30 are provided. The irradiation devices 30 in the room are connected.
[0047] The control system of the above-mentioned particle beam irradiation system 1 includes: an accelerator control device 40 for controlling the ion beam generating device 11 and the beam delivery device 14; a centralized control device 41 for centrally controlling the entire particle beam irradiation system 1; Conditional treatment planning device 43; storage device 42 for storing the information planned by the treatment planning device 43, the control informati...
Embodiment 2
[0107] Shows the second embodiment of the present invention. The device structure of this embodiment is the same as that of the first embodiment, but the target beam current value (I fb ) are corrected in different ways.
[0108] use Figure 9 The beam irradiation control flow will be described. and Figure 6 The difference is that instead of based on the comparative charge (Q comp ) target beam current value (I fb ) of the modified control ( Figure 6 818~820), and the setting is based on the amount of charge irradiated in advance (Q carry ) target beam current value (I fb )'s early correction control ( Figure 9 825-828).
[0109] In the case of the first embodiment, with the exit control time of the synchrotron (T ext ) passes through, the accumulated beam charge (Q meas )reduce. In addition, after becoming the emission control time (T ext ) in the second half of the time, it is considered that the accumulated beam charge (Q meas ) relative to the amount of ch...
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