Multifunctional modularized particle accelerator material radiation sample holder

Abstract

The invention discloses a multifunctional modularized particle accelerator material radiation sample holder, which belongs to the technical field of particle accelerator material radiation sample holders. The sample holder comprises a sample base, wherein the sample base is provided with a mechanical stretching module, a mechanical compression and TEM (Transmission Electron Microscopy) module, a radiation injection volume module and a radiation angle module; and the mechanical stretching module, the mechanical compression and TEM module, the radiation injection volume module and the radiationangle module are distributed in a matts form in sequence. By use of the sample holder, the radiation of multiple samples can be provided in one time, and radiation experiment time and sample consumption can be saved. By use of the sample holder, conventional mechanical experiment samples and TEM samples are organically combined with a radiation condition change sample, a great quantity of radiation sample data can be obtained in one time, material radiation damage differences caused by same parameter regulation setting and an unstable accelerator beam current state can be avoided, and result consistency is higher.

Description

technical field [0001] The invention relates to the technical field of particle accelerator material irradiation sample support, in particular to a multifunctional modular particle accelerator material irradiation sample support. Background technique [0002] In the study of radiation damage of materials in nuclear technology and applications, it is often necessary to use particle accelerators (tandem accelerators, ion implanters, synchrotron radiation light sources, etc.) ) surface causing surface damage or body damage to the irradiated material. Furthermore, mechanical tests, electron microscope analysis and other characterization methods are used to study the changes in radiation properties of nuclear materials such as radiation embrittlement, radiation swelling, and sputtering etching after particle bombardment. The samples irradiated by particle accelerators in this field are generally mirror-polished metal samples. The samples are cylinders or cuboids with fixed dimen...

AI Technical Summary

Problems solved by technology

The samples irradiated by particle accelerators in this field are generally mirror-polished metal samples. The samples are cylinders or cuboids with fixed dimensions. Complicated, cumbersome and inefficient

[0003] At present, most of these irradiation sample holders are accelerator standard traditional sample holders, which have simple functions and a single sample. It is difficult to adjust the sample irradiation parameters during the experiment, and the number of samples that can be loaded is limited. It is difficult to meet the demand for so many samples. Realized on the standard sample support, the radiation damage test of so many samples needs multiple rounds of experiments in batches, the irradiation cycle is long, the procedures are complicated, and the cost is high

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