A method and device for obtaining metamaterial refractive index distribution

Abstract

The invention discloses a method and a device for obtaining metamaterial refractive index distribution. The method and the device includes the steps of a. enabling electromagnetic wave to penetrate through metamaterial in a simulating mode, b. obtaining data which are used for describing and evaluating response to the electromagnetic of the metamaterial, wherein the data include distant field data after the electromagnetic wave penetrates through the metamaterial, and c. determining whether the difference between the target distant field data and the obtained simulated field data is bigger than a threshold value, if the difference between the target distant field data and the obtained distant simulated field data is smaller than or equal to the threshold value, changing the metamaterial refractive index distribution and returning to step a until the difference between the target distant field data and the obtained simulated distant field data is smaller than or equal to the threshold value. Due to the fact that the simulating mode is adopted, large amount of human resources, material resources and financial resources are saved, and target metamaterials which meets the requirements can be designed pointedly and quickly.

Description

technical field [0001] The invention relates to the field of metamaterials, in particular to a method and device for obtaining the refractive index distribution of metamaterials. Background technique [0002] Metamaterial (metamaterial) is a highly interdisciplinary emerging field that integrates electromagnetics, microwaves, terahertz, photonics, advanced engineering design, communications and other disciplines. [0003] When studying the response of materials to other electromagnetic waves such as microwaves, the response of any structure in the material whose scale is much smaller than the wavelength of the electromagnetic wave to electromagnetic waves can be described by the overall parameters of the material, the permittivity ε and the magnetic permeability μ. In general, the permittivity and permeability are determined by the response of each microstructure to electromagnetic waves. If the material has any required dielectric constant and permeability distribution thr...

AI Technical Summary

Problems solved by technology

The existing technology is to obtain the partial differential equation related to the refractive index n through MaxwellEquation and EikonalEquation, and then numerically solve the distribution of the refractive index n. This process is relatively cumbersome and complicated

Or design metamaterials by manually repeatedly setting values, simulating values, adjusting values, and re-simulating values ​​until the optimal result is obtained. This design process is blind and wastes a lot of manpower, material and financial resources, and may not be found. Target metamaterial required

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