Microscope automatic focusing method based on sample determination surface plane equation

A plane equation and auto-focus technology, applied in microscopes, optics, instruments, etc., can solve the problems of restricting the popularization and application of auto-focus technology, reducing the number of focusing times, and high cost

Inactive Publication Date: 2013-06-19
姚伯元
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  • Abstract
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  • Claims
  • Application Information

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Problems solved by technology

Therefore, arranging more focus points loses the actual use value;
[0007] (2) The relationship between the focus point coordinates cannot be used to simplify the focusing process and reduce the number of focusing times;
These shortcomings and the high cost of additional devices restrict the popularization and application of this type of automatic focusing technology.

Method used

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  • Microscope automatic focusing method based on sample determination surface plane equation

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Embodiment Construction

[0046] After the automatic focusing technology based on the equation of the sample measurement surface is adopted in the HD automatic microscope photometer, the expected effect is achieved. Since the focus and direction of the same measurement line are the same, the adjustment is continuous, and the adjustment is completed at one time. There is no repeated adjustment that may exist in the independent focus, and each time only takes about half a second. Because the mechanical error caused by the gear gap of the transmission part will not be accumulated during continuous adjustment in the same direction, the adjustment accuracy is high. Since the number of focusing is greatly reduced, the total focusing time for measuring a sample is much less than that of independent focusing. Under the condition of ensuring the clear image of the sample, no matter how many points are scanned, the total focusing time can be within 2 minutes. When the number of points scanned by the sample is 10,...

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Abstract

The invention discloses a method which confirms a determination point out-of-focus deviation amount according to a sample determination surface plane equation to achieve automatic focusing. The method comprises building a method of the sample determination surface plane equation, improving representativeness of the sample determination surface plane equation, removing a mechanical error in the process of automatic focusing, reducing measures like focusing times, adequately controlling a servo system and the like. The total focusing time does not exceed 2 minutes to achieve the aim that an automatic scanning determination sample still keeps an accurate focusing state.

Description

technical field [0001] The utility model belongs to the field of automatic focusing of an optical microscope and is suitable for automatic determination of samples. Background technique [0002] The necessity of focusing the microscope [0003] Determining that the sample is clearly imaged within the quasi-focus range of the optical microscope objective lens is called quasi-focus. The process of adjusting the focal length of the microscope so that the sample is in focus is called focusing. After the sample is moved, it generally needs to be focused to be in focus again. Microscopes have focusing knobs that can drive the microscope stage up and down to achieve focusing. Some high-end microscopes are also equipped with electronic control devices, and the corresponding buttons are operated to control the motor to drive the focusing knob to focus. Insufficient parallelism between the top and bottom of the sample flattener, the rebound of the plasticine so that the sample can...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G02B21/24
Inventor 姚伯元吴亚东李德平
Owner 姚伯元
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