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A method and device for obtaining test parameters

A technology of experimental parameters and acquisition methods, applied in the field of metamaterials, can solve problems such as too time-consuming, labor-consuming, and resource-consuming, and achieve the effect of controlling scale

Active Publication Date: 2016-01-20
KUANG CHI INST OF ADVANCED TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

If the number of levels corresponding to each parameter is a larger number, such as 30, 30, it is necessary to carry out It is undoubtedly too time-consuming, labor-intensive, and resource-consuming to arrange so many simulation experiments.

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  • A method and device for obtaining test parameters
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  • A method and device for obtaining test parameters

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Embodiment Construction

[0038] The following will clearly and completely describe the technical solutions in the embodiments of the present invention with reference to the accompanying drawings in the embodiments of the present invention. Obviously, the described embodiments are only some, not all, embodiments of the present invention. Based on the embodiments of the present invention, all other embodiments obtained by persons of ordinary skill in the art without creative efforts fall within the protection scope of the present invention.

[0039] In the embodiment of the present invention, the uniform test design strategy is applied to the electromagnetic characteristic measurement test of the metamaterial microstructure unit for the first time, and it is combined with random sampling, which not only ensures the spatial uniformity and representativeness of the selected test points, but also effectively The coverage of test point selection is guaranteed.

[0040] Such as figure 2 As shown, it is a s...

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Abstract

An embodiment of the invention discloses a test parameter obtaining method and device. The test parameter obtaining method includes that structural parameters of a structural body and the parameter level of the structural parameters are selected according to structural characteristics of the structural body of a metamaterial unit; a uniform test point group used during measuring of the electromagnetic property of the structural body of the metamaterial unit is obtained on the basis of a uniform test design strategy; a test area is divided into a plurality of local test sub areas according to the a uniform test point group; the structural parameters are respectively sampled randomly in the plurality of local test sub areas to obtain a random test point group for measuring the electromagnetic property of the structural body of the metamaterial unit; and the uniform test point group and the random test point group are adopted as practical test point groups for measuring the electromagnetic property of the structural body of the metamaterial unit. The test parameter obtaining method and device can be used for obtaining the appropriate test point groups to measure the electromagnetic property.

Description

technical field [0001] The invention relates to the field of metamaterials, in particular to a method and device for acquiring test parameters. Background technique [0002] exist In the field of metamaterials, that is, the field of artificial electromagnetic material design, measuring the electromagnetic properties of artificial electromagnetic material unit structures (or structural units) is an important link in the process of artificial electromagnetic material design 。 How to select a certain size of artificial electromagnetic material unit structure for electromagnetic simulation measurement is a problem that must be solved in the entire design process. [0003] Corresponding to a single microstructure unit, its structural characteristics (eg, geometric shape information) are generally described by a set of parameters, and the value of the parameter represents the size of the shape. Within a reasonable range of parameter values, each parameter corresponds to multiple...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01R29/08
Inventor 刘若鹏季春霖刘斌
Owner KUANG CHI INST OF ADVANCED TECH