Optical measurement assist device with oval calotte structure and optical measurement system
A technology of elliptical surface and auxiliary device, which is applied in the direction of testing optical performance, etc., can solve the time-consuming problems of optical measurement operations, and achieve the effect of high operating efficiency
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[0042] Such as figure 1 and figure 2As shown, it discloses the first preferred embodiment of the optical measurement aid with an elliptical surface structure of the present invention. The optical measurement aid with an elliptic surface structure includes a rotating reflective member 1 and a rotating drive mechanism 2, in:
[0043] The rotating reflective member 1 includes an internal reflection elliptical surface 10, a first focal point 11 and a second focal point 12, the internal reflection elliptical surface 10 is a part of an ellipsoid internal surface and has a reference center Axis 13, that is, an ellipse-shaped inner curved surface is divided into one-Nth (N is a positive integer) block with respect to the reference central axis 13, so that the rotating reflection member 1 has small volume, low material cost, and internal reflection. The elliptical surface 10 is easy to do surface treatment, and the surface is highly accurate; the first focal point 11 and the second ...
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