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Conducting anti-chamfering scanning electron microscope metallographic phase sample and preparation method thereof

A technology of angle scanning and electron microscopy, which is applied in the field of metallographic samples and their preparation, can solve problems affecting observation and measurement, easy chamfering of metallographic samples, etc., and achieve the effects of low cost, uniform distribution, and improved mechanical properties

Inactive Publication Date: 2013-07-10
HARBIN INST OF TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The purpose of the present invention is to solve the problem that the metallographic sample prepared in the prior art is easy to be chamfered, thereby affecting observation and measurement, and to provide a conductive anti-chamfering SEM metallographic sample and its preparation method

Method used

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  • Conducting anti-chamfering scanning electron microscope metallographic phase sample and preparation method thereof

Examples

Experimental program
Comparison scheme
Effect test

specific Embodiment approach 1

[0008] Specific implementation mode 1: This implementation mode is a kind of conductive anti-chamfer scanning electron microscope metallographic sample made of bakelite powder, TiB 2 and alcohol, wherein the bakelite powder and TiB 2 The volume ratio is 5:(0.1~3); the volume ratio of the bakelite powder and alcohol is 1:(0.8~1.2).

[0009] Add TiB to the conductive anti-chamfer scanning electron microscope metallographic sample described in this embodiment 2 For conductive filler, choose TiB 2 In addition to being used as a conductive filler, it can also improve the mechanical properties of the composite conductive polymer material. The hardness value of the conductive anti-chamfer scanning electron microscope metallographic sample described in this embodiment is HRE82-86, which has good wear resistance and can be used effectively. Anti-chamfer.

specific Embodiment approach 2

[0010] Embodiment 2: The difference between this embodiment and Embodiment 1 is that the particle size of the bakelite powder is less than 3mm. Others are the same as the first embodiment.

specific Embodiment approach 3

[0011] Embodiment 3: The difference between this embodiment and Embodiment 1 or 2 is that the TiB 2 The particle size is less than 3 μm. Others are the same as those in Embodiment 1 or 2.

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Abstract

The invention relates to a metallographic phase sample and a preparation method thereof, and in particular relates to a conducting anti-chamfering scanning electron microscope metallographic phase sample and a preparation method thereof, aiming at solving the problem that a metallographic phase sample prepared by the prior art are prone to chamfering, so that observation and measurement are influenced. The conducting anti-chamfering scanning electron microscope metallographic phase sample is prepared from bakelite powder, TiB2 and alcohol. The method comprises the steps of: 1, preparing mixed powder; and 2, molding to obtain the conducting anti-chamfering scanning electron microscope metallographic phase sample. The conducting anti-chamfering scanning electron microscope metallographic phase sample has the advantages that the metallographic phase sample has the hardness value of HRE 82-86, has good wear resistance and effectively prevents chamfering; the mixed powder is simple to prepare and low in cost; the alcohol is taken as a coupling agent, so that the cost is low; and the TiB2 is even in distribution. The method is mainly used for preparing the conducting anti-chamfering scanning electron microscope metallographic phase sample.

Description

technical field [0001] The invention relates to a metallographic sample and a preparation method thereof. Background technique [0002] When doing material scanning electron microscope metallographic observation, it is required that the metallographic sample and the sample platform must be electrically connected, and some scanning electron microscope metallographic observation samples need to be processed into a certain shape and size due to various reasons. Put the metallographic sample into a mold of a certain shape, add fillers such as bakelite powder or electric jade powder and other organic polymers, and then apply pressure and raise it to a certain temperature (120-130°C) to solidify to prepare the sample. The sample prepared by this method has certain strength and hardness, high sample preparation efficiency, low price, and is convenient for polishing and grinding. Since this kind of filler is not conductive, it is necessary to connect the observed conductive sample ...

Claims

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Application Information

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IPC IPC(8): G01N1/28
Inventor 王洪林王云璐耿林
Owner HARBIN INST OF TECH