Measurement turntable for bidirectional reflection distribution function of sample
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- HARBIN INST OF TECH
- Publication Date
- 2013-07-10
- Estimated Expiration
- Not applicable · inactive patent
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Abstract
Description
technical field
[0001] The invention relates to a turntable for measuring a bidirectional reflection distribution function of a sample, and belongs to the technical field of bidirectional reflection distribution function measurement. Background technique
[0002] The existing bidirectional reflectance distribution function BRDF measurement turntable has the following two types:
[0003] The first is:
[0004] The sample on the BRDF measurement turntable is stationary, the light source and the detector move, and can cover the measurement of the hemispherical space of the sample. It has the following disadvantages:
[0005] (1) The light source needs to be directly installed on the moving device. It is difficult to replace the light source with different wavelengths, and a motor with a large output torque is required to drive it;
[0006] (2) The volume of the device is generally large, and the machining accuracy of the mechanical structure is high, the cost is greatly incre...