Method for Detecting and Determining Qualified Areas of Optical Characteristics of Deformed Film Filters
A technology of thin film filter and qualified area, which is applied in the field of optical characteristic detection of thin film filter, can solve the problem that the qualified area of optical characteristics of deformed thin film filter is difficult, save the cost of testing equipment, and ensure the quality of optical characteristics. Effect
Active Publication Date: 2016-01-20
AUXORA SHENZHEN
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[0003] In summary, the purpose of the present invention is to solve the technical problem that the optical characteristic qualified area of the deformed film filter is difficult, and the proposed method for detecting and judging the optical characteristic qualified area
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[0024] The method of the present invention will be further described below in conjunction with the accompanying drawings and specific embodiments of the present invention.
[0025] The method for detecting and judging the qualified area of the optical characteristics of the deformed film filter is characterized in that the method includes the following steps:
[0026] A. In the air environment, with a preset incident angle, use the Cary500 UV-Vis-NIR spectrophotometer to test the transmittance curve of the uncoated optical glass substrate separately. The uncoated optical glass substrate and the coated optical glass substrate The undeformed coated substrate and the deformed film filter substrate in the same furnace have the same transmittance curve; the transmittance curve is used as a reference baseline; the uncoated optical glass substrate has a certain angle resolution accuracy (the higher the accuracy, the better) The angle adjustment table is fixed.
[0027] For example...
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The method for detecting and judging the qualified area of the optical characteristic of the deformed thin-film optical filter relates to the technical field of optical characteristic detection of the thin-film optical filter. To solve the technical problem that the area of qualified optical characteristics of the deformed film filter is difficult, the steps are: A. Separately test the transmittance curve of the uncoated optical glass substrate as a reference baseline; B. The uncoated optical glass substrate and the same furnace without deformation The coated surface of the coated sample is glued together, and the transmittance curve of the composite layer sample is tested; C. Compare the transmittance curve of the composite layer sample with the theoretical design data in the same environment to obtain the offset; D. Separate test The transmittance curve of the coated and undeformed sample at the time of vertical incidence is used to obtain the evaluation standard for the qualified area of the optical characteristics of the deformed film filter; Standard, to determine whether the transmittance curve of the dotted area is qualified, so as to obtain the qualified area of the deformed film filter.
Description
technical field [0001] The invention relates to the technical field of optical characteristic detection of thin film filters. Background technique [0002] When testing the optical characteristics of thin-film filters, ordinary spectrophotometers generally use air (refractive index 1.0) as the incident and outgoing medium when testing the light transmission or reflectance of thin-film filters, and it is difficult to directly realize different refractions. Uniformity test of optical characteristics under high-rate working medium environment, especially when the surface shape of the thin film filter sample is also severely deformed. Contents of the invention [0003] To sum up, the purpose of the present invention is to solve the technical problem that the qualified region of the optical characteristic of the deformable film filter is difficult, and proposes a method for detecting and judging the qualified region of the optical characteristic. [0004] In order to solve the...
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IPC IPC(8): G01M11/02
Inventor 唐守利陆文林耀忠
Owner AUXORA SHENZHEN