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Package assembly and method of forming the same

A technology for packaging components and substrates, which is applied in the direction of electrical components, electrical solid devices, semiconductor devices, etc., and can solve problems such as problems with solder ball dripping performance

Active Publication Date: 2013-07-24
TAIWAN SEMICON MFG CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Solder ball placement or ball drop (ball drop) process is used in WLCSP technology, but there are still problems with solder ball drop performance

Method used

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  • Package assembly and method of forming the same
  • Package assembly and method of forming the same
  • Package assembly and method of forming the same

Examples

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Embodiment Construction

[0029] The making and using of embodiments of the present disclosure are discussed in detail below. It should be appreciated, however, that the embodiments provide many applicable inventive concepts that can be embodied in a wide variety of specific contexts. The specific embodiments discussed are merely specific ways to make and use the embodiments, and do not limit the scope of the disclosure. Embodiments described herein relate to the utilization of bump structures for semiconductor devices. As will be discussed below, embodiments disclose the use of bump structures for attaching one substrate to another, where each substrate can be a die, wafer, interposer, printed circuit board, packaging substrate, etc., allowing the following attachments: die-to-die, wafer-to-die, wafer-to-wafer, die or wafer to interposer substrate or printed circuit board or packaging substrate, etc. Like reference numerals are used to refer to like elements in the various drawings and illustrated e...

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Abstract

A package assembly including a semiconductor die electrically coupled to a substrate by an interconnected joint structure. The semiconductor die includes a bump overlying a semiconductor substrate, and a molding compound layer overlying the semiconductor substrate and being in physical contact with a first portion of the bump. The substrate includes a no-flow underfill layer on a conductive region. A second portion of the bump is in physical contact with the no-flow underfill layer to form the interconnected joint structure.

Description

[0001] Cross References to Related Applications [0002] This application claims priority to US Provisional Patent Application No. 61 / 590,255, filed January 24, 2012, the entire contents of which are hereby incorporated by reference. technical field [0003] The present invention relates to the manufacture of package assemblies, and more particularly, to the manufacture of package assemblies for semiconductor devices. Background technique [0004] Modern integrated circuits are made up of millions of active devices such as transistors and capacitors. These devices are initially isolated from each other, but are then interconnected to form functional circuits. Typical interconnect structures include lateral interconnects such as metal lines (wires) and vertical interconnects such as vias and contacts. The performance and density of modern integrated circuits are increasingly constrained by interconnects. On top of the interconnect structure, bond pads are formed and expose...

Claims

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Application Information

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IPC IPC(8): H01L23/498H01L21/60
CPCH01L2224/16227H01L2224/13139H01L2224/83855H01L23/3114H01L24/29H01L2224/05124H01L2224/05681H01L2224/05644H01L23/498H01L2224/05647H01L2224/27334H01L23/525H01L2224/13144H01L24/05H01L2224/0347H01L2224/13116H01L24/16H01L2224/03612H01L2224/05666H01L2224/13155H01L24/13H01L2224/02311H01L2224/0239H01L2224/05166H01L2224/92125H01L2224/13147H01L2224/2919H01L2224/05147H01L21/563H01L24/03H01L2224/27416H01L2224/131H01L2224/0362H01L2224/05187H01L2224/05008H01L2224/05655H01L2224/05582H01L2224/1146H01L2224/13113H01L24/81H01L2224/16225H01L2224/81024H01L2224/024H01L2224/13111H01L24/83H01L2224/03614H01L24/92H01L2224/11849H01L2224/81815H01L2224/05611H01L24/94H01L23/3171H01L24/11H01L2224/94H01L2224/05073H01L24/02H01L2224/83192H01L2224/27318H01L2224/73204H01L2224/81203H01L2224/11334H01L2224/0401H01L2224/13022H01L2224/16145H01L21/566H01L24/27H01L2224/81191H01L2924/12042H01L2924/181H01L2224/81H01L2924/01029H01L2924/01013H01L2924/00014H01L2924/04941H01L2924/04953H01L2924/014H01L2924/01047H01L2224/11H01L2924/00H01L21/565H01L21/768H01L2224/21H01L2224/81801H01L2924/2076
Inventor 林鸿仁王宗鼎李建勋吕文雄郑明达刘重希
Owner TAIWAN SEMICON MFG CO LTD
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