Broadband large size plane grating diffraction efficiency tester
A flat grating and diffraction efficiency technology, applied in the field of spectroscopy, can solve the problems that the grating diffraction efficiency tester cannot measure the grating diffraction efficiency and cannot realize the measurement of the full-aperture diffraction efficiency of a large-scale grating.
Active Publication Date: 2013-08-14
CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI
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[0005] In order to solve the problem that the existing grating diffraction efficiency tester cannot realize the measurement of the diffraction efficiency of the grating in the range of 1100nm-2500nm and the measurement of the full-aperture diffraction efficiency of the larger-sized grating, it provides a wide-band large-size plane Grating Diffraction Efficiency Tester
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[0013] Specific implementation mode 1. Combination figure 2 and image 3 Description of this embodiment, a broad-band large-size planar grating diffraction efficiency tester, including a light source system, a pre-monochromator, a measuring monochromator, a detection system and a controller 17; the light source includes a tungsten lamp 1, a deuterium lamp 2. The first plane reflector 19, the second plane reflector 20 and the condenser 3; the front monochromator includes the first incident slit 4, the first concave collimator 5, the splitting grating group 23, and the first turntable 22. A first concave imaging mirror 21, a first exit slit 24, and a pre-monochromator housing 8; the measuring monochromator includes a second entrance slit 9, a second concave collimator mirror 10, and a second turntable 26. The second concave imaging mirror 27, the second exit slit 28 and the measuring monochromator housing 18; in the light source system outside the front monochromator housing 8...
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A broadband large size plane grating diffraction efficiency tester relates to the field of spectrum technology, solves the problem that the conventional grating diffraction efficiency tester cannot be used for measuring the diffraction efficiency in the broadband range, and includes a light source system, a pre-positioned monochromator, a measuring monochromator, a detecting system and a controller, as well as a first plane mirror, a second plane mirror and a collecting lens, wherein the pre-positioned monochromator includes a concave surface collimating lens, a spectro-grating group, a first rotating table, a first concave surface imaging lens and a pre-positioned monochromator casing; the measuring monochromator includes a second entrance slit, a second concave surface collimating lens, a second rotating table, a second concave surface imaging lens and a measuring monochromator casing; and the testing system is used for obtaining the diffraction luminous flux of a reference plane mirror and the diffraction luminous flux of a plane grating to be tested respectively, and obtaining the diffraction efficiency of the plane grating to be tested through obtaining the specific value of the diffraction luminous flux of the plane grating to be tested to the diffraction luminous flux of the reference plane mirror. The diffraction efficiency tester can be used for measuring the heavy caliber plane grating diffraction efficiency.
Description
technical field [0001] The invention relates to the field of spectrum technology, in particular to a broad-band and large-size planar grating diffraction efficiency tester. Background technique [0002] Diffraction gratings (hereinafter referred to as gratings) are the core components of spectroscopic analysis instruments. Diffraction efficiency is one of the most important technical indicators for evaluating the performance of gratings, and it is also the basic factor for evaluating the energy transmission characteristics of spectroscopic instruments. Diffraction efficiency is divided into absolute diffraction efficiency and relative diffraction efficiency. In actual measurement, the diffraction efficiency usually refers to the relative diffraction efficiency, that is, the ratio of the diffracted luminous flux of a given order and wavelength received by the detector to the reflected luminous flux received by the standard reflector. The same grating has different diffracti...
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IPC IPC(8): G01M11/02
Inventor 陈少杰曹海霞齐向东巴音贺希格崔继承唐玉国朱文煜
Owner CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI