System integration device and system integration method for test parameters based on unit combination

A technology for system integration and test parameters, applied in the transmission system, electrical components, transmission monitoring, etc., can solve the problems of standardization, general flexibility, poor scalability, closed system of comprehensive testing and fault diagnosis system, high hardware cost, etc. Achieve the effects of reducing technical risk, long service life, and easy construction

Inactive Publication Date: 2013-08-14
THE 41ST INST OF CHINA ELECTRONICS TECH GRP
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  • Abstract
  • Description
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Problems solved by technology

[0002] Although the automatic test system built by traditional instruments plays an important role in weaponry, it also exposes many problems: 1) The comprehensive test and fault diagnosis system built by traditional instruments has a closed system and a single platform, so it is standardized and versatile , poo

Method used

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  • System integration device and system integration method for test parameters based on unit combination

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Embodiment 1

[0040] Such as figure 1 As shown, the present invention summarizes the principles of the universal test instrument, takes signal generation and reception as the research object, and divides the entire test system into the lowest open standard hardware test unit: baseband signal generation unit, up-conversion generation unit, Down-conversion generating unit, digitizer generating unit and switch unit, among which the basic test unit is the smallest unit and foundation of the test system. It is neither a unitized instrument with complete instrument functions in the past nor a simple conforming to a certain standard. The bus interface card is composed according to the basic principles of modern measuring instruments, and a series of units with complete structure and independent functions are designed according to the realization function, the use of technical integrity, and the standardization and standardization of the interface. These units alone cannot directly complete the func...

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Abstract

The invention relates to a system integration device and a system integration method of test parameters based on the unit combination. The device comprises a main control computer and an exchange board, and also comprises a switch unit, a lower variable-frequency generation unit, a digitalized instrument generation unit, a base band signal generation unit and an upper variable-frequency generation unit, which are connected and communicated with one another; the lower variable-frequency generation unit is matched with the digitalized instrument generation unit and used for receiving and testing a test signal; and the base band signal generation unit is matched with the upper variable-frequency generation unit and used for generating and transmitting an excitation signal. By adopting the scheme, a test system with high performance and low cost is easy to establish, and different instrument functions can be realized by maximally utilizing fewest standard universal units.

Description

Technical field [0001] The invention belongs to the technical field of automatic testing, and particularly relates to a system integration device and method based on unit combination for testing parameters. Background technique [0002] Although the automatic test system constructed by traditional instruments plays an important role in weapons and equipment, it also exposes many problems: 1) The comprehensive test and fault diagnosis system constructed by traditional instruments is closed and the platform is single, so it is standardized and versatile. , Flexibility and poor scalability. Similar instruments of different companies lack a unified interface standard, and the compatibility between instruments is very poor; 2) The comprehensive test and fault diagnosis system constructed by traditional instruments has high hardware cost, large size, and difficulty in upgrading and maintenance. Traditional instruments are test instruments with complete instrument functions. They have ...

Claims

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Application Information

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IPC IPC(8): H04B17/00H04L29/08H04B17/30
Inventor 杨志兴陶芳胜黄珍元邱畅李龙
Owner THE 41ST INST OF CHINA ELECTRONICS TECH GRP
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