System integration device and system integration method for test parameters based on unit combination

Abstract

The invention relates to a system integration device and a system integration method of test parameters based on the unit combination. The device comprises a main control computer and an exchange board, and also comprises a switch unit, a lower variable-frequency generation unit, a digitalized instrument generation unit, a base band signal generation unit and an upper variable-frequency generation unit, which are connected and communicated with one another; the lower variable-frequency generation unit is matched with the digitalized instrument generation unit and used for receiving and testing a test signal; and the base band signal generation unit is matched with the upper variable-frequency generation unit and used for generating and transmitting an excitation signal. By adopting the scheme, a test system with high performance and low cost is easy to establish, and different instrument functions can be realized by maximally utilizing fewest standard universal units.

Description

Technical field [0001] The invention belongs to the technical field of automatic testing, and particularly relates to a system integration device and method based on unit combination for testing parameters. Background technique [0002] Although the automatic test system constructed by traditional instruments plays an important role in weapons and equipment, it also exposes many problems: 1) The comprehensive test and fault diagnosis system constructed by traditional instruments is closed and the platform is single, so it is standardized and versatile. , Flexibility and poor scalability. Similar instruments of different companies lack a unified interface standard, and the compatibility between instruments is very poor; 2) The comprehensive test and fault diagnosis system constructed by traditional instruments has high hardware cost, large size, and difficulty in upgrading and maintenance. Traditional instruments are test instruments with complete instrument functions. They have ...

AI Technical Summary

Problems solved by technology

[0002] Although the automatic test system built by traditional instruments plays an important role in weaponry, it also exposes many problems: 1) The comprehensive test and fault diagnosis system built by traditional instruments has a closed system and a single platform, so it is standardized and versatile , poor flexibility and scalability

To sum up, the existing test system integration methods are instrument-oriented both in hardware construction and system implementation. Although the system implementation is relatively simple, the hardware cost is high and it is difficult to meet the needs of modern test development.

Images