Automatic design and experimental simulation method for digital circuits
A digital circuit and automatic design technology, applied in the direction of electrical digital data processing, calculation, special data processing applications, etc., can solve problems such as experiments that cannot be completed within the specified time, complicated error correction, and device damage
Inactive Publication Date: 2013-09-04
SHANDONG UNIV
View PDF2 Cites 7 Cited by
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
If the logical relationship between the two is not correct, check whether the circuit connection is consistent with the designed schematic diagram. If not, modify the design. If they are consistent, you need to correct the error on the circuit of the experiment box. There are leaking wires, device damage, design problems, etc., which are often impossible to check in the actual experiment process, so that the experiment cannot be completed within the specified time
Method used
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View moreImage
Smart Image Click on the blue labels to locate them in the text.
Smart ImageViewing Examples
Examples
Experimental program
Comparison scheme
Effect test
Embodiment Construction
[0006] An automatic design and experimental simulation method for a digital circuit, comprising the following steps:
[0007] (1) Input logical expression: convert the simplest expression required by the experiment into a logical expression that can be realized by a specified device, and the experimenter inputs the logical expression into the computer; the logical expression includes AND (&), or (|), not (!), XOR (^) four logical operators, brackets (()) and letters;
[0008] (2) Automatic or manual selection of devices: preset device library, which includes all digital integrated circuit components; devices correspond to device functional relational expressions or state equations one by one, and the functional relational expressions and state equations include logic symbols, brackets and variables, which are called formal variables in the present invention;
[0009] a. The computer automatically selects the device from the device library according to the input logical expres...
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More PUM
Login to View More Abstract
The invention relates to an automatic design and experimental simulation method for digital circuits and particularly relates to a digital circuit experiment based method capable of generating logic circuit diagrams automatically according to logic expressions and conducting circuit design and simulation. The method comprises the steps of inputting the logic expressions, automatically or manually selecting devices, automatically drawing the logic circuit diagrams and displaying pin marks, and conducting digital circuit experiment simulation and manual correction. The automatic design and experimental simulation method for the digital circuits serves as an auxiliary tool for digital circuit experiments and is very convenient and effective for users performing the digital circuit experiments, by the aid of the method, schematic circuit diagrams verified via computer simulation can be obtained, and the problems that hand-painted circuit diagrams are complicated and errors of the hand-painted circuit diagrams are difficult to correct are solved.
Description
technical field [0001] The invention relates to a digital circuit automatic design and experiment simulation method, belonging to the technical field of digital circuit experiment automatic design and simulation. Background technique [0002] Usually when people do digital circuit experiments, they first analyze the experiment, list the truth table according to the experimental requirements, write out the expression and turn it into the simplest logic expression, and then use the selected device or specified device to realize the simplest logic expression. Draw the schematic diagram, complete the circuit connection on the experiment box according to the schematic diagram, and finally verify the input-output relationship. If the logical relationship between the two is not correct, check whether the circuit connection is consistent with the designed schematic diagram. If not, modify the design. If they are consistent, you need to correct the error on the circuit of the experim...
Claims
the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More Application Information
Patent Timeline
Login to View More IPC IPC(8): G06F17/50
Inventor 尹立新张伟伟徐庆嵩
Owner SHANDONG UNIV