Detecting device and system of chip physical integrity
A technology of integrity detection and detection device, which is applied in the direction of platform integrity maintenance, etc., can solve the problems of large resistance value, difficulty in physical realization of layout, large occupied area, etc., and achieve the effect of reducing the area
Active Publication Date: 2013-09-04
DATANG MICROELECTRONICS TECH CO LTD
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Problems solved by technology
[0006] 1) The pull-up (or pull-down) resistor has a large resistance value and occupies a large area
[0007] 2) The pull-up (or pull-down) resistor cannot be placed directly in the standard cell area, and the physical realization of the layout is difficult
[0008] 3) The leakage is large, and there is always a current from the power supply to the ground under normal conditions
Method used
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[0026] In order to make the purpose, technical solution and advantages of the present invention more clear, the embodiments of the present invention will be described in detail below in conjunction with the accompanying drawings. It should be noted that, in the case of no conflict, the embodiments in the present application and the features in the embodiments can be combined arbitrarily with each other.
[0027] Such as figure 1 As shown, the chip physical integrity detection device according to the embodiment of the present invention includes a metal detection wire network and a plurality of level detection modules, one end of the metal detection wire network is grounded, and a plurality of detection points are set on the metal detection wire network. Each detection point is connected to a level detection module,
[0028] The level detection module is used to detect the potential of the detection point connected to it, and output an abnormal signal when the potential of the ...
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The invention discloses a detecting device and system of chip physical integrity and relates to the field of detection of the chip physical integrity. The detecting device comprises a metal detecting wire network and a plurality of level detecting modules; one end of the metal detecting wire network is grounded; the metal detecting wire network is provided with a plurality of detecting points and every detecting point is connected with a level detecting module; and the level detecting modules are used for detecting potentials of the detecting points which are connected with the level detecting modules and outputting abnormal signals when the potentials of the detecting points are abnormal. The detecting system comprises a controller and the detecting device, wherein the abnormal signals which are output from the level detecting modules are transmitted to the controller. According to the detecting device and system of the chip physical integrity, whether the chip physical integrity is damaged or not can be accurately detected, a pull-up resistor or a pull-down resistor is not needed, and the area of the detecting device of the chip physical integrity is reduced.
Description
technical field [0001] The invention relates to the field of chip physical integrity detection. Background technique [0002] Intrusive attacks on chips, also known as physical attacks, refer to information snooping and malicious damage to the inside of chips by attackers through physical means (such as with the help of special instruments and equipment). Including stripping, probe, focused ion beam FIB, etc. One of the current solutions to physical attacks is top-level metal detection. When the chip is subjected to physical attack, the top metal will be damaged, and the detection device will detect the damage of the top metal and send out an alarm signal. [0003] Existing top-layer metal detection generally adopts a pull-up resistive detection method or a pull-down resistive detection method. The pull-up resistor detection method means that one end of the metal detection wire network is grounded, and the other end is connected to the power supply through a large-value p...
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IPC IPC(8): G06F21/50
Inventor 何其高洪福李军
Owner DATANG MICROELECTRONICS TECH CO LTD