Three-dimensional scanner measuring method and device

A measurement method and technology of a measurement device, applied in the direction of measurement devices, optical devices, instruments, etc., can solve problems such as large errors, and achieve the effect of avoiding huge costs

Active Publication Date: 2013-09-11
贵阳嘉瑜光电科技咨询中心
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Problems solved by technology

Therefore, the error is large
At the same time, in three-dimensional surface shape measurement, the phase value measured by the phase method is a principle phase value, which differs

Method used

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  • Three-dimensional scanner measuring method and device
  • Three-dimensional scanner measuring method and device

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Embodiment Construction

[0033] The technical scheme of the present invention and its principles are further described in detail below in conjunction with the accompanying drawings of the embodiments:

[0034] 1. The principle of sinusoidal virtual light field generation

[0035] Illumination objects are projected for virtual sinusoidal gratings using a Michelson interferometer generation method. Such as figure 1 As shown, the required spatial carrier frequency can be obtained by adjusting the mirror M. R in the figure is the reference plane. The virtual sinusoidal grating is projected onto the reference plane R by the projection system, and then captured by the CCD camera. Finally, the captured data is sent to the computer for processing. The light intensity distribution can be expressed as:

[0036]

[0037] The above formula expresses the grating position offset due to the projection optical axis being perpendicular to the reference plane R.

[0038]2. Measuring principle of small angle grati...

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Abstract

The invention discloses a three-dimensional scanner measuring method and device. The measuring method adopts virtual sinusoidal grating formed by interferometric fringes or spatial modulated patterns to project on a reference plane and an object surface, subjects the same to phase demodulation by a phase method, and finally obtains three-dimensional information of the object surface. The three-dimensional scanner measuring method includes steps of (1) generating sinusoidal virtualization or spatial modulation light field; (2) measuring by a small-angle grating difference-frequency method; (3) forming a light path for measuring of the small-angle grating difference-frequency in the step (2) by a color separation projection system; (4) unwrapping by small-angle difference-frequency phase. The measuring device comprises a projection system, a shooting system and a computer which are arranged on the same side of the reference plane R, the projection system is arranged above the shooting system, and the computer is respectively connected with the shooting system and a printer. The three-dimensional scanner measuring method and device overcome the defects of existing three-dimensional measuring methods, has good effect and can be applicable to the integral manufacturing industry.

Description

technical field [0001] The invention belongs to the technical field of three-dimensional scanning measurement, and relates to a three-dimensional scanner measurement method and a device thereof. Background technique [0002] Three-dimensional scanning is a high-tech that integrates optical, mechanical, electrical and computer technologies. It is mainly used to scan the spatial shape, structure and color of objects to obtain the spatial coordinates of the object's surface. Its significance lies in the ability to convert the three-dimensional information of the object into a digital signal that can be directly processed by the computer, which provides a very convenient and quick means for the digitization of the object. However, traditional 3D scanning devices are mostly contact scanners or laser scanners. The contact measurement speed is slow, the mechanical structure is complex, and the surface characteristics of objects are easy to be damaged. It is increasingly unable to m...

Claims

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Application Information

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IPC IPC(8): G01B11/25
Inventor 季泳
Owner 贵阳嘉瑜光电科技咨询中心
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