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Memory migration method, memory migration device and equipment

A memory and device technology, applied in the computer field, which can solve problems such as interruption of memory business processes

Inactive Publication Date: 2013-09-25
HUAWEI TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0009] Embodiments of the present invention provide a memory migration method, device and equipment, capable of migrating process-related data in an abnormal memory segment to an allocated memory segment in a non-abnormal state, thereby solving the problems existing in the prior art due to memory failure As for the technical problems that lead to the interruption of business processes in the memory, the specific technical solutions are as follows:

Method used

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  • Memory migration method, memory migration device and equipment
  • Memory migration method, memory migration device and equipment
  • Memory migration method, memory migration device and equipment

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Embodiment 1

[0107] Such as figure 2 Shown is a flow chart of a memory migration method in an embodiment of the present invention, the method comprising:

[0108] Step 201, detecting whether there is at least one first memory segment in an abnormal state.

[0109] First, in the system, according to the preset memory segmentation rules, the memory in the system is divided to generate M memory segments, where the value of M is a positive integer greater than or equal to 2.

[0110] Further, in the embodiment of the present invention, different division units can be selected for the division of the memory. Specifically, in Table 1, the system memory is divided according to the unit of the step size, and each divided memory segment is set to A tag value is provided with a parameter option in the embodiment of the present invention. The parameter option is an optional group of values. The size of the memory segment. In this embodiment of the present invention, the range of the memory segmen...

Embodiment 2

[0185] Corresponding to a memory migration method in the embodiment of the present invention, a memory migration device is also provided in the embodiment of the present invention, such as Image 6 Shown is a specific structural diagram of the memory migration device, which includes:

[0186] A detection unit 601, configured to detect whether there is at least one first memory segment in an abnormal state, and send the detection result to the instruction generation unit 602;

[0187] The instruction generation unit 602 is connected to the detection unit 601, receives the detection result of the detection unit 601, and is used to generate a memory migration instruction when the detection result indicates that there is at least one first memory segment in an abnormal state , and send the memory migration instruction to the parsing unit 603;

[0188] Since there are multiple memory segments in the system, if there is at least one first memory segment in the system in an abnormal...

Embodiment 3

[0228] Corresponding to a memory migration method in the embodiment of the present invention, the embodiment of the present invention also provides a device, such as Figure 13 Shown is a specific structural schematic diagram of a device in an embodiment of the present invention, the device includes:

[0229] The first processing chip 140 is configured to detect whether there is at least one first memory segment in an abnormal state, and generate a memory migration instruction when the first memory segment exists.

[0230] The basic input and output chip 141 is connected to the first processing chip 140, receives the memory migration instruction, parses the memory migration instruction, and obtains memory information parameters in the memory migration instruction, and the memory information parameters are used for Indicating whether the at least one first memory segment in the abnormal state corresponds to at least one process.

[0231] The second processing chip 142 is conne...

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Abstract

An embodiment of the invention provides a memory migration method, a memory migration device and equipment. The method includes the steps: detecting whether at least one first memory segment is in an abnormal state or not; generating a memory migration instruction when at least one first memory segment is in the abnormal state; analyzing the memory migration instruction; acquiring memory information parameters for indicating whether at least one first memory segment corresponds to at least one progress or not in the memory migration instruction; and migrating relevant data corresponding to at least one process to at least one second memory segment in the normal state from at least one first memory segment and storing the relevant data when at least one first memory segment corresponds to at least one process. Therefore, the problem of service interruption in a memory caused by memory failure in the prior art can be solved, so that running stability and reliability of service processes in a system are improved.

Description

technical field [0001] The present invention relates to the technical field of computers, in particular to a memory migration method, device and equipment. Background technique [0002] In the server system, the memory is one of the key modules of the system operation. The application business deployed on the operating system exists in the form of a process. During its operation, it needs to dynamically apply for a quantitative amount from the system according to the load of the application business. memory to function properly. [0003] figure 1 Shown is a schematic diagram of memory used by application services in the prior art, figure 1 In the application system 100, the application service (referred to as APP) exists in the form of a process. An application service system may contain several service processes, such as 102-1, ... 102-N. These processes must report to the operating system OS during operation. The memory module under management requires a certain amount ...

Claims

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Application Information

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IPC IPC(8): G06F12/06
Inventor 符德煌朱朋志
Owner HUAWEI TECH CO LTD
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