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Apparatus and method for measuring reflection characteristic of material

A measuring device and technology of reflection characteristics, applied in the field of optical radiation measurement, can solve the problems of long optical path of illumination optical path and reflected optical path, difficult to measure the spectral characteristics of materials, weak optical signal of retroreflection light, etc.

Active Publication Date: 2013-10-09
远方谱色科技有限公司
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  • Application Information

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Problems solved by technology

In this method, the optical path between the illumination light path and the reflection light path is long, and the optical signal of the retro-reflected light reaching the detector is very weak, so it is difficult to measure the spectral characteristics of the material; and the above-mentioned retro-reflection measurement needs to be carried out in a very large darkroom space , only suitable for the photometric measurement requirements of the laboratory, and cannot meet the requirements of industrial production lines and on-site rapid testing

Method used

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  • Apparatus and method for measuring reflection characteristic of material
  • Apparatus and method for measuring reflection characteristic of material
  • Apparatus and method for measuring reflection characteristic of material

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Embodiment 1

[0058] Such as figure 2As shown, this embodiment discloses a material reflectance measurement device, including a hollow excitation source 1, a monitoring device 2, a measuring device 3, a base 5, a converging device 6, a light blocking device 7 and an aperture 8. In this embodiment, the hollow excitation source 1 is a spiral flash lamp, and the spiral flash lamp is arranged between the base 5 and the measuring device 3, that is, the base 5 and the measuring device 3 are respectively located on both sides of the hollow excitation source 1, and the monitoring device 2 and The measuring devices 3 are all spectrometers; the light blocking device 7 here is a light blocking plate, and the light blocking device 7 is arranged between the hollow excitation source 1 and the measuring device 3; the converging device 6 is a lens.

[0059] The measuring device 3, the converging device 6, the hollow excitation source 1 and the base 5 are arranged in sequence, the ratio of the distance fro...

Embodiment 2

[0068] In this embodiment, the standard spectral irradiance meter is used to calibrate the readings of the monitoring device 2, and the spectral radiation intensity standard lamp is used to calibrate the readings of the measuring device 3, so that the measurement of parameters such as the absolute spectral radiation intensity coefficient and the luminous intensity coefficient of the measured sample 4 can be realized. , the measurement steps are as follows:

[0069] (1) Place a standard spectral irradiance meter at 4 places of the tested sample. Under the irradiation of the hollow excitation source 1, the standard spectral irradiance meter measures the spectral irradiance of the illuminated surface as ; The measurement result of the monitoring device 2 is R' S (λ). Replace the standard spectral irradiance meter with the measured sample 4, and the reading of the monitoring device 2 is R' T (λ), then the spectral irradiance on the illuminated surface of the tested sample 4 is...

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Abstract

The invention discloses an apparatus and a method for measuring the reflection characteristic of a material. The apparatus comprises a hollow excitation source, a monitoring device and a measuring device, wherein light emitted by the hollow excitation source shines on a sample to be measured, the measuring device receives reflected light which is reflected by the sample to be measured and passes through the hollow part of the hollow excitation source, the monitoring device monitors the spectral information of the light emitted by the hollow excitation source, and by using the corresponding measuring method disclosed by the invention, the comprehensive spectral reflection characteristic of the sample to be measured can be obtained through measuring and calculating. The apparatus and method disclosed by the invention are clever in design and simple in light path, can realize the rapid and accurate measurement of the luminosity, chroma and spectral characteristics of retro-reflection of materials without using an optical darkroom, and has the characteristics of powerful functions, high measurement accuracy, small volume, low cost, design integration, and the like.

Description

【Technical field】 [0001] The invention belongs to the field of optical radiation measurement, and in particular relates to an optical reflection characteristic measurement device and method. 【Background technique】 [0002] Materials with good reflective properties, especially good retroreflective properties, are widely used in automobiles, motor vehicles, warning signs, etc., and play a key role in road traffic and personal safety. Reflective properties or retro-reflective properties are key technical indicators of this type of material, and it is of great significance to measure them effectively. Since the measurement of retroreflective properties of materials must be carried out in the direction where the incident and receiving optical paths coincide or are very close, the technical difficulty is extremely high. So far, there is no effective device or device suitable for the measurement of spectral properties of retroreflectors or materials. method. [0003] The traditio...

Claims

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Application Information

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IPC IPC(8): G01N21/55G01N21/25
CPCG01N21/4738
Inventor 潘建根
Owner 远方谱色科技有限公司
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