Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Free space terminal short-circuit system for temperature changing measurement of dielectric property of dielectric material

A technology of dielectric materials and dielectric properties, applied in the measurement of electrical variables, resistance/reactance/impedance, measurement devices, etc., can solve the problems of low test efficiency, cumbersome calibration, and difficulty, so as to reduce the time spent and reduce The number of measurements, the effect of reducing calibration errors

Inactive Publication Date: 2013-10-09
UNIV OF ELECTRONIC SCI & TECH OF CHINA
View PDF3 Cites 22 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0009] The purpose of the present invention is to provide a free space terminal short-circuit test system for the variable temperature test of the dielectric properties of dielectric materials, to realize the variable temperature test of the dielectric properties of dielectric materials, to solve the problem of the traditional short-circuit test system for the dielectric properties of dielectric materials. Existing technical problems of cumbersome calibration, high difficulty, low test efficiency and large errors

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Free space terminal short-circuit system for temperature changing measurement of dielectric property of dielectric material
  • Free space terminal short-circuit system for temperature changing measurement of dielectric property of dielectric material
  • Free space terminal short-circuit system for temperature changing measurement of dielectric property of dielectric material

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0036] Free space terminal short-circuit system for variable temperature testing of dielectric properties of dielectric materials, such as figure 1 As shown, it includes a material heating system 1, a millimeter-wave broadband conical horn antenna 2, a signal energy transmission and receiving system 3, a vector network analyzer 4, a water cooling system 5, and a vacuum system 6.

[0037] The material heating system 1 adopts a mobile vacuum platform structure, and the system includes two quartz lenses 111 and 112 , a vacuum cover 13 , an electromagnetic induction heating device 14 and a mobile platform 15 . Two identical quartz lenses 111 and 112 are symmetrically mounted on the center line of the top broadside of the vacuum cover 13 (that is, the geometric centers of the quartz lenses 111 and 112 are located on the center line of the top wide side of the vacuum cover 13, and about the wide side of the top of the vacuum cover 13 The midpoint of the midline is symmetrical); the ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention, which relates to the technical field of dielectric property testing of a dielectric material, provides a free space terminal short-circuit system for temperature changing measurement of a dielectric property of a dielectric material. The system comprises a material heating system, a millimeter-wave broadband horn antenna, a signal energy transmission receiving system, a vector network analyzer, a water cooling system, and a vacuum-pumping system. The millimeter-wave broadband horn antenna is fixed right above the material heating system; and the vacuum-pumping system is connected with the signal energy transmission receiving system by a cable. A testing signal passes through a conversion adapter, an isolator, and a coupler and reaches the antenna; the signal is reflected by a tested sample and the reflected signal passes through the antenna; and the coupler carries out coupling and the processed signal is coupled into the vector network. According to the invention, the isolator and the coupler are used to simplify a calibration process and shorten calibration and testing time; the whole system can use a mobile platform to complete testing under the heating device idling and no-idling circumstances at the same temperature, thereby substantially improving the testing efficiency.

Description

technical field [0001] The invention belongs to the technical field of dielectric property testing of dielectric materials, in particular relates to microwave and millimeter wave material dielectric property testing technology, in particular to a free-space terminal short-circuit system for variable temperature testing of dielectric properties of dielectric materials. Background technique [0002] With the rapid development of technology in aviation, aerospace and related military fields, the speed of various aircraft is getting faster and faster, and the requirements for the development of high-temperature materials are also getting higher and higher. When the working environment temperature of the material changes, its dielectric properties will also change accordingly. Therefore, it is of great significance to realize the variable temperature test of materials and grasp the dielectric properties of dielectric materials at different working temperatures for the design and ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01R27/26
Inventor 李恩何山郭高凤寇彬彬崔红玲戈弋徐芳海
Owner UNIV OF ELECTRONIC SCI & TECH OF CHINA
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com