Free space terminal short-circuit system for temperature changing measurement of dielectric property of dielectric material

A technology of dielectric materials and dielectric properties, applied in the measurement of electrical variables, resistance/reactance/impedance, measurement devices, etc., can solve the problems of low test efficiency, cumbersome calibration, and difficulty, so as to reduce the time spent and reduce The number of measurements, the effect of reducing calibration errors

Inactive Publication Date: 2013-10-09
UNIV OF ELECTRONIC SCI & TECH OF CHINA
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Problems solved by technology

[0009] The purpose of the present invention is to provide a free space terminal short-circuit test system for the variable temperature test of the dielectric properties of dielectric materials, to realize the variable temperature test of the dielectric proper

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  • Free space terminal short-circuit system for temperature changing measurement of dielectric property of dielectric material
  • Free space terminal short-circuit system for temperature changing measurement of dielectric property of dielectric material
  • Free space terminal short-circuit system for temperature changing measurement of dielectric property of dielectric material

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Embodiment Construction

[0036] Free space terminal short-circuit system for variable temperature testing of dielectric properties of dielectric materials, such as figure 1 As shown, it includes a material heating system 1, a millimeter-wave broadband conical horn antenna 2, a signal energy transmission and receiving system 3, a vector network analyzer 4, a water cooling system 5, and a vacuum system 6.

[0037] The material heating system 1 adopts a mobile vacuum platform structure, and the system includes two quartz lenses 111 and 112 , a vacuum cover 13 , an electromagnetic induction heating device 14 and a mobile platform 15 . Two identical quartz lenses 111 and 112 are symmetrically mounted on the center line of the top broadside of the vacuum cover 13 (that is, the geometric centers of the quartz lenses 111 and 112 are located on the center line of the top wide side of the vacuum cover 13, and about the wide side of the top of the vacuum cover 13 The midpoint of the midline is symmetrical); the ...

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Abstract

The invention, which relates to the technical field of dielectric property testing of a dielectric material, provides a free space terminal short-circuit system for temperature changing measurement of a dielectric property of a dielectric material. The system comprises a material heating system, a millimeter-wave broadband horn antenna, a signal energy transmission receiving system, a vector network analyzer, a water cooling system, and a vacuum-pumping system. The millimeter-wave broadband horn antenna is fixed right above the material heating system; and the vacuum-pumping system is connected with the signal energy transmission receiving system by a cable. A testing signal passes through a conversion adapter, an isolator, and a coupler and reaches the antenna; the signal is reflected by a tested sample and the reflected signal passes through the antenna; and the coupler carries out coupling and the processed signal is coupled into the vector network. According to the invention, the isolator and the coupler are used to simplify a calibration process and shorten calibration and testing time; the whole system can use a mobile platform to complete testing under the heating device idling and no-idling circumstances at the same temperature, thereby substantially improving the testing efficiency.

Description

technical field [0001] The invention belongs to the technical field of dielectric property testing of dielectric materials, in particular relates to microwave and millimeter wave material dielectric property testing technology, in particular to a free-space terminal short-circuit system for variable temperature testing of dielectric properties of dielectric materials. Background technique [0002] With the rapid development of technology in aviation, aerospace and related military fields, the speed of various aircraft is getting faster and faster, and the requirements for the development of high-temperature materials are also getting higher and higher. When the working environment temperature of the material changes, its dielectric properties will also change accordingly. Therefore, it is of great significance to realize the variable temperature test of materials and grasp the dielectric properties of dielectric materials at different working temperatures for the design and ...

Claims

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Application Information

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IPC IPC(8): G01R27/26
Inventor 李恩何山郭高凤寇彬彬崔红玲戈弋徐芳海
Owner UNIV OF ELECTRONIC SCI & TECH OF CHINA
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