Hierarchical fast three-dimensional measurement device and measurement method based on structured light projection

Abstract

The invention discloses a hierarchy-type rapid three-dimensional measuring device and method based on structured light projection. The device comprises a structured light projection unit, binocular image acquisition units and a data processing unit, wherein patterns of structured light projected by the structured light projection unit comprise a square grid array, and a gray level gradient area is formed in each grid unit; a plurality of characteristic circles are distributed at intersecting points of grid lines in a square dot matrix mode; the data processing unit is used for receiving left and right parallax images acquired by the binocular image acquisition units, and for decoding so as to acquire three-dimensional information, including pixel point depth coordinates, of a measured field, wherein the positions of the characteristic circles in the left and right parallax images are detected and matched, the grid lines of corresponding areas in the left and right parallax images are detected and matched by taking the matched characteristic circles as the center, areas, which are defined by two transverse and longitudinal adjacent grid lines in match are subjected to gray level matching, and the depth coordinates of pixel points are determined according to the acquired pixel point parallax. By utilizing the device and the method, which are provided by the invention, the real-time three-dimensional measurement of the measured field is accomplished rapidly and precisely.

Description

technical field [0001] The invention relates to the field of optical and computer vision measurement, in particular to a hierarchical fast three-dimensional measurement device and measurement method based on structured light projection. Background technique [0002] Obtaining real-time and accurate three-dimensional information of objects using optical and computer vision technology is a very important research field with a very broad application background. The three-dimensional information acquisition method of structured light projection uses a structured light projection device to project structured light to the scene under test according to a predetermined projection program. After the structured light pattern is projected onto the scene under test, it will be modulated by the three-dimensional information of the scene under test. In this way, the structured light pattern is deformed, and a single or multiple cameras are used to collect the structured light pattern, and...

AI Technical Summary

Problems solved by technology

[0004] 1. The structured light mode is too simple to carry enough coding information, or the structured light mode is complex enough but the decoding algorithm cannot make full use of the structured light coding information

[0005] 2. Some existing 3D measurement systems cannot perform good measurements on dynamic scenes

[0006] 4. Although some 3D measurement systems can measure dynamic scenes, the error is relatively large

[0007] 5. The 3D measurement system used in occasions with high precision requirements is expensive and the cost performance is not high, which greatly limits the promotion of the 3D measurement system

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