Method for generating testing vectors of artificial circuit

Abstract

The invention relates to a method for generating testing vectors of an artificial circuit. The method for generating the testing vectors of the artificial circuit comprises the steps of carrying out testability analysis on the circuit to be tested, namely the optimum testing node set of the circuit to be tested is selected from valid testing nodes according to a testability measurement value T of the circuit to be tested, and when the testability measurement value T is smaller than the number of circuit elements in the circuit to be tested, regular ambiguity sets are determined and at most one element is selected from each set to serve as the element to be diagnosed; establishing the sensitivity equation of each testing point in the optimum testing node set according to the variance (y(t)-y'(t)) <2> and obtaining a needed testing vector set by calculating the frequency of the extreme point of a flexibility curve, wherein y(t) is the normal output of each testing node and the y'(t) is the fault output of each testing node; deleting part of the testing vectors in the testing vector set to optimize the number of the testing vectors. The method for generating the testing vectors of the artificial circuit has the advantages that the complexity of calculation and processing is reduced, and the fault diagnosing speed is improved. The method for generating the testing vectors of the artificial circuit is particularly suitable for being used for testing and diagnosis of large-scale analogue integrated circuits.

Description

technical field [0001] The invention relates to the technical field of integrated circuit testing, in particular to a method for generating analog circuit test vectors (test excitation). Background technique [0002] The nature of signals in the objective world determines the ubiquity and irreplaceability of analog circuits, so it is particularly important to carry out relevant theoretical and methodological research. With the rapid development of electronic technology, especially the increase in the density and integration of integrated circuits, the available test points are limited, and the traditional way of intervening through external contacts has been powerless. The research and application of this technology provide an opportunity for development. [0003] In recent years, researchers have carried out a lot of work on analog circuit fault diagnosis, but less attention has been paid to the generation of test vectors, which are usually selected based on experience, su...

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Problems solved by technology

[0003] In recent years, researchers have carried out a lot of work on analog circuit fault diagnosis, but less attention has been paid to the generation of test vectors

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