Error calibration device and method

A technology of error calibration and offset error, which is applied in the field of error calibration devices, can solve the problems of low data accuracy, data cannot be projected in the system, and large gaps, etc., and achieve the effect of simple structure

Active Publication Date: 2013-12-18
BYD SEMICON CO LTD
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  • Application Information

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Problems solved by technology

But the disadvantage of this method is that the data cannot show the current system situation, but only the average value of a period of time
For systems with high real-time requirements, this method cannot be used
In addition, another disadvantage of averaging is that the accuracy of the data is not high and the gap with real-time data is large

Method used

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  • Error calibration device and method

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Embodiment Construction

[0026] Embodiments of the present invention are described in detail below, examples of which are shown in the drawings, wherein the same or similar reference numerals designate the same or similar elements or elements having the same or similar functions throughout. The embodiments described below by referring to the figures are exemplary and are intended to explain the present invention and should not be construed as limiting the present invention.

[0027] In addition, the terms "first" and "second" are used for descriptive purposes only, and cannot be interpreted as indicating or implying relative importance or implicitly specifying the quantity of indicated technical features. Thus, a feature defined as "first" and "second" may explicitly or implicitly include one or more of these features. In the description of the present invention, "plurality" means two or more, unless otherwise specifically defined.

[0028] In the present invention, unless otherwise clearly specified...

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Abstract

The invention discloses an error calibration device. The error calibration device comprises a data initialization module, a calibration module and an output module; the data initialization module is used for receiving original data, establishing a two-dimensional reference coordinate system according to the original data and corresponding theoretical values, calculating a corresponding interval of the original data on the two-dimensional reference coordinate system and calculating a plurality of reference points according to the interval; the calibration module is used for calculating an offset error according to the plurality of reference points and calculating a gain error according to the original data and the plurality of reference points; the output module is used for compensating the original data according to the offset error and the gain error and outputting actual values after compensation. The invention also discloses an error calibration method. According to the error calibration device and method, the data are divided into a plurality of areas through the reference points which are obtained through a test, calibration is performed on the data in a drop point, the structural change of the system is small, any circuit before data generation is not changed, and the structure is simple; the calibration accuracy of the data is improved; the real-time performance of the data cannot be affected.

Description

technical field [0001] The invention relates to the technical field of signal processing, and particularly designs an error calibration device and an error calibration method. Background technique [0002] In the process of engineering application, data error is unavoidable. The source and size of data errors in different systems are not the same. In the case of knowing the input data of the system, for example, the output data of the sigma_delta ADC through the CIC filter is used as the input data of a certain system. Since the data added before the ADC is known, the CIC output data has a standard value. Due to the influence of the environment and the circuit itself, the voltage output before the ADC is not the desired value. The accuracy of the data is not high, so that if the design requirements cannot be met, the data must be calibrated. [0003] There are two existing error processing methods for this type of error processing: [0004] (1) Deal with the source of th...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/07
Inventor 魏伟李黎何志强杨云
Owner BYD SEMICON CO LTD
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