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Linear displacement laser interferometer calibrating method and device based on four-standard optical axis

A laser interferometer and laser interference technology, applied in the direction of using optical devices, measuring devices, instruments, etc., can solve the problems of large Abbe error, unequal optical path, inaccurate calibration measurement results, etc., and achieve small Abbe error. Effect

Active Publication Date: 2015-02-11
HARBIN INST OF TECH
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Problems solved by technology

Since the two sets of laser interferometers are placed in parallel, the two paths of light are similarly affected by the environment, and the refractive index of air has little influence on the two paths of light. Big error
[0004] figure 2 It is a schematic diagram of the face-to-face laser interferometer calibration device. The standard measuring mirror and the calibrated measuring mirror are installed on the moving platform face to face. The advantage is that the measuring beam axes of the two sets of laser interferometers can be adjusted to almost the same measuring axis. The Abbe error is very small. The disadvantage is that the near end of one interferometer is the far end of the other.
[0005] In 2011, the National Institute of Metrology established the first 80-meter long-length laser interferometer measurement device in China (Leng Yuguo, Tao Lei, Xu Jian. Analysis of the accuracy and influencing factors of the dual-frequency laser interferometer system based on the 80-meter measurement device. Metrology and Testing Technology, 2011, 38(9): 47-49), the standard device used is to place three Agilent5530 long-distance dual-frequency laser interferometers in parallel to form a three-way laser interferometer, and the calibrated laser interferometer The instrument is placed between them for calibration and calibration. This scheme is a derivative of the parallel calibration method, and since three-way light is used for simultaneous measurement, it can compensate for the Abbe error during measurement. However, since three lasers are placed in parallel Therefore, the spatial position of the three-way standard measurement light is relatively far away, and the distance between the measurement light of the calibrated laser interferometer and each standard measurement light is also relatively long. All measurement light paths are affected by the environment differently, and the air refractive index has inconsistent effects on all measurement light paths. , resulting in inaccurate calibration measurements
Since the two sets of laser interferometers share one interferometer group and measuring mirror, it is impossible to determine whether the shared interferometer group and measuring mirror belong to the standard laser interferometer part or the calibrated standard laser interferometer part. Therefore, it is not exactly two sets Calibration of the laser interferometer for calibration

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  • Linear displacement laser interferometer calibrating method and device based on four-standard optical axis
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  • Linear displacement laser interferometer calibrating method and device based on four-standard optical axis

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Embodiment Construction

[0025] The specific embodiments of the present invention will be described in further detail below in conjunction with the accompanying drawings.

[0026] A linear displacement laser interferometer calibration device based on four standard optical axes. It includes a standard laser interferometer laser 1 and four laser interferometers configured to receive four parallel standard measuring beams 3, 4, 5, and 6 corresponding to the interference signal positions. Receivers 8, 9, 10, 11, wires connect the four receivers 8, 9, 10, and 11 to the standard laser interferometer signal processing system 12; the standard laser interferometer laser 1 output optical path is equipped with a middle through hole 16 is the four-axis hollow standard laser interferometer group 2 through which the measuring beam 15 of the calibrated laser interferometer can pass; the four-axis hollow standard laser interferometer group 2 is equipped with a guide rail 21 on one side, and the motion table 20 is install...

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Abstract

The invention discloses a linear displacement laser interferometer calibrating method and device based on a four-standard optical axis, and belongs to the technical field of laser measurement. Measuring light beams of a calibrated laser interferometer pass through the middle through hole of a four-axle hollow laser interference mirror group; the measuring light beams of the calibrated laser interferometer are arranged in parallel in the centers of four parallel standard measuring light beams which are distributed in the forms of lateral edges of a regular quadrangular prism; in a plane vertical to the four standard measuring light beams and in a square area formed by the projection points of the four standard measuring light beams on the plane, the difference between the environment interference degrees of the four standard measuring light beams and the measuring beams of the calibrated laser interferometer is very small, and the average value of the refractive indexes of the four standard measuring light beams is close to the air refractive index values of the measuring light beams of the calibrated laser interferometer.

Description

Technical field [0001] The invention belongs to the technical field of laser measurement, and mainly relates to a laser interferometer calibration method and device. Background technique [0002] Laser interferometer measurement of linear displacement technology is a high-precision standard measurement technology, widely used in precision and ultra-precision machining, microelectronics equipment, nanotechnology industrial equipment and national defense equipment, in order to ensure the accuracy of laser interferometer measurement of linear displacement , A scientific and effective linear displacement laser interferometer calibration method and device are needed. The general idea of ​​calibrating a linear displacement laser interferometer is to use a linear displacement laser interferometer with a higher accuracy level for calibration. When the accuracy of the two is similar, it is called a comparison. In the actual calibration work, most of the linear displacement laser interfer...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01B9/02G01B11/02
Inventor 胡鹏程谭久彬
Owner HARBIN INST OF TECH
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