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79 results about "Abbe error" patented technology

Abbe error, named after Ernst Abbe, also called sine error, describes the magnification of angular error over distance. For example, when one measures a point that is 1 meter away at 45 degrees, an angular error of 1 degree corresponds to a positional error of over 1.745 cm, equivalent to a distance-measurement error of 1.745%. In machine design, some components are particularly sensitive to angular errors.

Device and method for detecting contours of large-caliber aspheric surface components

The invention belongs to the technical field of optical precision tests, and relates to a device and a method for precisely detecting large-caliber aspheric surfaces. The device and the method can be used for detecting the contours of large aspheric surface components in precision optical systems in a high-precision manner. The device is of an open type contour instrument structure with rotary-linear datum common base planes on the basis of linear/rotary datum technologies and the like, so that the contours of the large-caliber aspheric surface components can be detected on the basis of precision flotation rotary centers in the high-precision manner. The device and the method have the advantages that common base plane designs for rotary-linear datum systems, turning designs for measurement frames and designs for open type non-gantry structures are adopted, Abbe errors of instruments can be reduced, the movement precision of a precision linear flotation guide rail can be realized to the greatest extent, and parameters of the contour of a mother line of each to-be-detected aspheric surface can be directly measured by a sensing measuring system which synchronously moves with the precision linear flotation guide rail; the contours of multiple mother lines of the to-be-detected aspheric surfaces can be measured by the aid of precision flotation rotary technologies, and the contours of the large-caliber aspheric surfaces can be quickly detected in the high-precision manner by means of fitting.
Owner:BEIJING INSTITUTE OF TECHNOLOGYGY

Length measurement precision calibrating method and device for laser tracker

ActiveCN105157574AAvoid Cumulative ErrorsEasy calibration of length measurement accuracyUsing optical meansOptoelectronicsPrism
A length measurement precision calibrating method and device for a laser tracker belongs to the measurement and calibration field of optical instruments, and are aimed at solving the problems of the prior art that the calibrating precision of an ultra-long high-precision guide rail is low, the machining cost is high, the length measurement range is small and the occupation space is large. An interference length of a double-frequency laser interferometer is taken by the calibrating device as a length basis. Platforms spaced from each other at certain intervals within the measurement range and an adjustable pedestal above the platforms together form a high-precision virtual guide rail. Right-angle prism units are utilized to adjust the space of two measurement light beams, and five prism units are utilized for turning of light paths. In this way, length measurement precision calibration is conducted on a laser tracker within the ultra-long measurement range in a limited space. The calibrating method includes the steps: leveling a light beam of a laser interferometer; adjusting the virtual guide rail to realize flatness and linearity that are needed by calibration; adjusting an emitting light beam of the laser tracker to enable the emitting light beam to be parallel to the light beam of the laser interferometer; forming a measurement optical path; fixing a reflector, and adjusting the two measurement light beams and enabling the two light beams to parallel to each other so that an Abbe error is eliminated; conducting measurement; and performing data processing.
Owner:CHANGCHUN UNIV OF SCI & TECH

Source tracing calibrating device and source tracing method for micro cantilever beam elastic constant

The invention provides a source tracing calibrating device for a micro cantilever beam elastic constant. The source tracing calibrating device structurally comprises a marble frame, a nanometer balance, a micro cantilever beam, a three-dimensional micro-nano displacement platform, a force loading rod, a polarization difference interferometer, an instrument controller, a computer and measuring and controlling software. The invention meanwhile provides a source tracing method of the source tracing calibrating device for the micro cantilever beam elastic constant. The source tracing calibrating device and source tracing method have the advantages that an elastic constant value can be directly traced to the international system of unit SI when the device is used, micro light spots, formed on the upper surface of the free end of the micro cantilever beam, of measuring light beams of the polarization difference interferometer completely coincide with force loading points when the lower surface of the free end of the micro cantilever beam is loaded by the force loading rod on the nanometer balance through the device, so that the Abbe arm is zero, the Abbe principle of displacement measuring is abided by, generation of Abbe errors is avoided, and the measurement accuracy of a source tracing instrument is ensured. Uniformity, reliability and comparability of micro force measuring by using the micro cantilever beam in different labs can be ensured.
Owner:TIANJIN UNIV

Micron-nano grade three-dimensional measurement '331' system and measurement method thereof

The invention provides a micro-nano level 3-D measurement '331' system and a measurement method thereof. The system is characterized in that X, Y and Z-axis standard-measure dimension lines or extended lines thereof of the 3-D measurement system are arranged to be perpendicular to one another and intersect at one intersection point, so as to establish a 3-D coordinate system taking the intersection point as a coordinate origin; an X-axis guide-rail guide plane and a Y-axis guide-rail guide plane of a measurement platform in the measurement platform are arranged to be coplanar with a measurement plane where a measuring-head central point is, so as to form a coincidence plane; the intersection point of the X, Y and Z-axis standard-measure dimension lines or the extended lines thereof is on the coincidence plane of the measurement platform; meanwhile, the X and Y-axis standard-measure dimension lines or the extended lines thereof are also arranged to coincide with three planes, so as to ensure that X and Y coordinate planes of the established coordinate system coincide with the measurement plane; and the measuring-head central point is arranged to coincide with the intersection point of the three standard-measure dimension lines or the extended lines thereof. The invention satisfies the Abbe principle in 3-D direction, thereby effectively avoiding Abbe errors and guaranteeing high measurement precision.
Owner:HEFEI UNIV OF TECH

Error measurement system and method for high-precision linear guide rail

The invention belongs to the field of geometric accuracy detection, and particularly discloses an error measurement system and method for a high-precision linear guide rail. The system comprises a fixed unit and a mobile unit, wherein the fixed unit is arranged on a fixed plane of a numerical control machine tool and comprises a helium-neon laser, a first beam splitter prism, a second beam splitter prism, a polarization beam splitter prism, a first 1/4 wave plate and a first four-quadrant detector; and the mobile unit is arranged on a mobile workbench of the numerical control machine tool andcomprises a pyramid prism. According to the invention, the pyramid prism which is insensitive to angles is adopted to measure the straightness error, so that the crosstalk and the measurement error caused by the angle change can be effectively avoided; meanwhile, the pyramid prism is arranged on the axis or the paraxial line, so that the influence of the Abbe error on the measurement result can beeffectively reduced, and the precision of the straightness measurement is improved; and the six-degree-of-freedom synchronous measurement can be realized by arranging other devices, and each error isdecoupled and separated, so that the accuracy of the measurement result is improved.
Owner:HUAZHONG UNIV OF SCI & TECH

Machine tool error modeling method based on two-dimensional Abbe error and instantaneous movement center

The invention discloses a machine tool error modeling method based on a two-dimensional Abbe error and an instantaneous movement center, and relates to the technical field of machine tool error compensation. The machine tool error modeling method comprises the following steps: analyzing a deflection instantaneous center, a pitching instantaneous center and a rolling instantaneous center of an X and Y-axis guide track system of a stack working table; analyzing the deflection instantaneous center, the pitching instantaneous center and the rolling instantaneous center of a Z-axis guide track system; establishing corresponding deflection-Abbe error, pitching-Abbe error and rolling-Abbe error models. By adopting the machine tool error modeling method, the deflection instantaneous center, the pitching instantaneous center and the rolling instantaneous center of guide track systems in different motion directions can be analyzed, and the corresponding deflection-Abbe error, pitching-Abbe error and rolling-Abbe error models can be established. The zero drift error, the indication error and the guide track system Abbe error of a grating measurement system can be comprehensively considered according to the multi-body dynamic theory, a comprehensive numerically-controlled machine tool error model can be established, basis can be provided for next error compensation, and thus the processing precision of a numerically-controlled machine tool can be effectively improved.
Owner:ANHUI UNIV OF SCI & TECH

Method and device for measuring free-form surface based on reference plane comparative measurement

ActiveCN110057337AImproved scan detection accuracyAbbe's error is smallUsing optical meansFree formSurface level
The invention discloses a method and a device for measuring a free-form surface based on reference plane comparative measurement, and belongs to the technical field of optical precision detection. Themethod uses the high-precision plane flat crystal as a reference plane of an X-Y surface, utilizes the high-precision height measurement sensor and the free-form surface measurement sensor which arecoaxially installed to detect the high-precision plane flat crystal and the surface height information of the measured free-form surface respectively, utilizes the high-precision height measurement sensor to acquire the surface height information of the high-precision plane flat crystal to monitor and compensate the straightness error of an X-direction air-floatation guide rail and a Y-direction air-floatation guide rail, performs dimension reduction error separation on the surface appearance of the free-form surface, and realizes the nanometer precision detection of the appearance of the free-form surface. The method and the device for measuring the free-form surface based on reference plane comparative measurement can realize the detection of the free-form surface, provide high-precisionthree-dimensional linear positioning and scanning measurement, inhibit the influence of the straightness error of the movement of the X-direction guide rail and the Y-direction guide rail on the measurement of the free-form surface, reduce the influence of the Abbe error of the Z axis on the measurement, and realize the large-range and nanometer precision measurement of the free-form surface.
Owner:BEIJING INSTITUTE OF TECHNOLOGYGY

Abbe error compensation method and system based on machine tool positioning precision measurement

ActiveCN111338291AImproved final positioning accuracyProgramme controlComputer controlMeasurement deviceControl engineering
The invention discloses an abbe error compensation method and system based on machine tool positioning precision measurement. The method comprises the steps: arranging a laser interferometer of a measurement device on a machine tool, carrying out the optical debugging, and enabling the laser interferometer to be in a to-be-measured state; recording a measurement program of the numerical control system to enable the program of the numerical control system to be consistent with measurement parameters of the laser interferometer; measuring the positioning error of the machine tool, and generatingan error compensation parameter table; measuring the distance between the emitted light of the laser interferometer and the central axis of the corresponding transmission lead screw, and recording the data as Abbe arm length; and the numerical control system performs superposition operation according to the error compensation parameter table and the abbe error value to generate a compensated positioning error compensation value, and drives the servo motor to perform feeding movement according to the positioning error compensation value to perform error compensation. The method has the advantages that the Abbe error generated in the measurement process is considered, the Abbe error is superimposed on the compensation value to serve as the final positioning precision of the machine tool, and the compensation precision is greatly improved.
Owner:HUBEI UNIV OF ARTS & SCI +2

Grating ruling tool initiative adjusting device having abbe error correcting function

The invention relates to the technical field of grating ruling and particularly discloses a grating ruling tool initiative adjusting device having an abbe error correcting function. The grating ruling tool initiative adjusting device comprises a tool rest lifting mechanism, a tool rest supporting frame, a micro positioning worktable, a worktable installation seat, flexible hinges, piezoelectric ceramics, tension springs, a small tool rest and a diamond ruling tool. The piezoelectric ceramics and the micro positioning worktable are in contact through friction, and the four symmetrical flexible hinges enable the micro positioning worktable to have large rigidity in direction except the Z-axis direction. The micro positioning worktable conducts micro positioning movement in the Z-axis direction under the stretching movement of the piezoelectric ceramics, and thus the displacement deviation between the actual position and the ideal position of the diamond ruling tool can be minimized. According to the grating ruling tool initiative adjusting device, a double-axis interferometer is used for measuring the position of the diamond ruling tool in real time, the influence of abbe measurement errors caused by using a one-axis interferometer on the positioning precision of the diamond ruling tool is avoided, the positioning error of the diamond ruling tool can be easily reduced, the grating ruling quality can be improved, and the performance index can be increased.
Owner:CHANGCHUN INST OF OPTICS FINE MECHANICS & PHYSICS CHINESE ACAD OF SCI

Dynamic revising method of three-coordinate measuring machine

The invention relates to a dynamic revising method of a three-coordinate measuring machine, and the method comprises: displacement measuring devices are respectively arranged at the side of the two parallel Y-axial guide rails of the three-coordinate measuring machine; when the measurement is carried out by the three-coordinate measuring machine, the displacement measuring devices respectively obtain the data of the two displacements of an X-axial movement beam on the Y-axial guide rails and the displacement measuring device on the X-axial movement beam also synchronously obtains the data of the displacement of a measuring probe on the X-axial movement beam; and the calculation is carried out through the three-coordinate measuring machine according to the data of the three displacements to obtain the real-time displacement data of the measuring probe on a Y-axial guide plane. The dynamic revising method of the three-coordinate measuring machine provided by the invention has the advantages of reasonable design and low application cost, can be suitable for the improvement of the existing three-coordinate measuring machine and the manufacture of a new three-coordinate measuring machine, and can be used for effectively eliminating the influence of Abbe errors on the measuring result and also effectively improving the speed and efficiency of the measurement.
Owner:昆山双虎电子科技有限公司

Meshing line large-specification gear measurement center

InactiveCN102322838ASmall sizeAchieve optimal layoutMeasurement devicesControl systemEngineering
The invention overcomes the defect of overlarge tangential travel of a gear measurement center when the error of a gear tooth form of a large gear is measured by adopting base circle generating method, thereby providing a meshing line large-specification gear measurement center which has the advantages of optimized layout and high measurement precision and comprises a C shaft used for fixing a gear to be measured, wherein the C shaft is a rotating shaft. The meshing line large-specification gear measurement center also comprises a sensor probe used for acquiring data of the gear tooth form to be measured, wherein the sensor probe is controlled to move along the meshing line of the gear to be measured by a control system. According to the invention, the tangential guide rail size of a measurement apparatus is remarkably shortened, the abbe error of the gear measurement center is effectively reduced without a measurement head alignment error, the tangential travel when the error of the gear tooth form is measured is reduced, the tangential direction and the radial direction of the apparatus are in the vertical coordinate axis, thus the influence of the abbe error is furthest reduced, the optimized layout of the apparatus structure is effectively realized, the measurement precision is improved, and the advantages of simple structure and convenience for installation location and operation are realized.
Owner:HARBIN JINGDA MEASURING INSTR

Ultra-precise three-coordinate testing platform

The invention provides an ultra-precise three-coordinate testing platform, comprising a base, a support connector and a first Z-direction upright post and a second Z-direction upright post. A square flat-plate vacuum preloading air-flotation support is mounted on the support connector; the support connector is driven by an X-direction linear motor; the first Z-direction upright post is fixed on the top of the support connector, the second Z-direction upright post is mounted at one side, and a circular-plate vacuum preloading air-flotation support is mounted at the bottom of the second Z-direction upright post; a Z-direction linear motor is mounted on the Z-direction upright post and is connected with two first vacuum preloading air-flotation assemblies; a gantry cross beam is fixed betweentwo first vacuum preloading air-flotation assemblies, and a Y-direction linear motor is mounted on the gantry cross beam and connected with a second vacuum preloading air-flotation assembly. By the vacuum preloading air flotation technology, the testing platform can move rapidly without any friction on the X,Y and Z directions respectively, the moving on the Z direction is driven directly by thelinear motor and the two-way vacuum preloading air-flotation assemblies, and thus Abbe error on the Z-direction is reduced.
Owner:深圳市金园智能科技有限公司

High-precision probe device used for linearity error measurement

ActiveCN108519046ASmall static and dynamic friction coefficientGood anti-climbing effectUsing electrical meansLinearity errorMeasurement precision
The invention belongs to the technical field of precision machining and testing, and discloses a high-precision probe device used for linearity error measurement. The device comprises a guide seat, amicro-displacement lever transmission system, a slide block system, a slide block driving system, a side pressure plate, an upper pressure plate, a cover plate, and a side baffle. According to the device, a polytetrafluoroethylene guide rail soft tape is adopted as a friction auxiliary material, and the motion stationarity of a slide block and a probe can be substantially improved in a lubricationstate; the position of a measuring point is located above an extending surface of a guide rail work surface so that the direction has no measuring Abbe error, and the measuring precision can reach the submicron magnitude; by employing a high-sensitivity crossed reed micro-displacement transmission lever, the micro-displacement acquired by a ball probe is transmitted to a high-precision inductionprobe in an equivalent manner, and the device is applicable to the measurement of high-precision linearity errors without direct adoption of an axial probe. The device is advantageous in that the structure is simple, the deformation is symmetric, the influence of the driving precision on the motion precision of the probe is small, measuring Abbe errors can be avoided, the measuring precision of linearity errors is high, and the application range is wide.
Owner:DALIAN UNIV OF TECH
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