Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

System for measuring hard disk magnetic head flight height and common-path dual-frequency laser interference measuring method

A high-flying, dual-frequency laser technology, applied in the field of optical measurement, can solve problems such as difficulty in improving measurement accuracy, and achieve the effects of avoiding light intensity calibration errors, high robustness, accuracy, and high stability

Inactive Publication Date: 2006-10-11
TSINGHUA UNIV
View PDF0 Cites 16 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

Therefore, when using traditional reflection to measure the flying height of the magnetic head relative to the disk, it is difficult to improve the measurement accuracy due to the error introduced by the change of the balance position of the disk.

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • System for measuring hard disk magnetic head flight height and common-path dual-frequency laser interference measuring method
  • System for measuring hard disk magnetic head flight height and common-path dual-frequency laser interference measuring method
  • System for measuring hard disk magnetic head flight height and common-path dual-frequency laser interference measuring method

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0035] The invention provides a system for measuring the flying height of a magnetic head of a hard disk and a common optical path laser interference measurement method. The structure and working principle of the system for measuring the flight performance of the hard disk magnetic head by dual-frequency laser heterodyne interferometry of the common optical path are described in detail in conjunction with the embodiments and accompanying drawings as follows:

[0036] The structure of this embodiment is as figure 2 The schematic diagram of the transmissive measurement and image 3 The schematic diagram of the reflective measurement is shown. Including: metering type transverse Zeeman He-Ne dual-frequency laser 1, used for spectroscopic detection of beat frequency reference signals; 10% reflective spectroscopic flat plate 2, semi-reflective spectroscopic flat plate 3 and mirror 12 constitute an adjustable beam splitting angle structure , small beam splitting angle Wollaston p...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention relates to a system for measuring disc magnetic head flying height and a share-path dual-frequency laser interference measure method, belonging to the optical measure technique. It comprises a transverse Zeeman laser, a low-reflective divide plate on the axes of laser sender, an adjustable splitting angle device formed by a semi-reflect divide plate and a reflector, a Woraston polarize splitting lens, a big diameter long focus lens, a magnetic head disc at the back focal plane of lens, two paths of interference and reference lights, a high-reflector, a deflection checker, and a optical-electric detector. The invention can improve the measure accuracy, resolution and sampling frequency, improve and compensate the Abbe error caused by the stable position change of disc, meet the demand of flying height that magnetic head relative to the glass simulate disc, and on the producing line, check the flying state of magnetic disc relative to the actual disc. The invention has lower cost, which it can be used in disc checking, and micro mechanical device vibration checking.

Description

technical field [0001] The invention belongs to the technical field of optical measurement, and in particular relates to a system for measuring the flying height of a hard disk magnetic head and a common optical path dual-frequency laser interference, which includes the measurement of the normal motion of the magnetic head slider under the test conditions of a glass disk simulated disk or a real disk. Measurement methods. Background technique [0002] With its advantages of rewritable, high speed, high stability, and high cost performance, magnetic storage technology will still be the most commonly used data storage method for a period of time in the future. Judging from the current development trend of magnetic storage technology, improving the storage density and read / write speed of magnetic storage products (such as hard disks) still has great commercial value and scientific research potential. Some foreign scholars believe that the areal density of magnetic storage is e...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
IPC IPC(8): G01B11/02G01B9/02G11B5/48
Inventor 孟永钢林德教岳兆阳宋南海殷纯永
Owner TSINGHUA UNIV
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com