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Temperature calibration device and method for integrated cmos temperature sensor

A temperature sensor and calibration device technology, which is applied in thermometer testing/calibration, thermometers, measuring devices, etc., can solve the problems of temperature reading value deviation and accuracy reduction, and achieve the effect of fast calibration and reduced test cost

Active Publication Date: 2016-11-02
SHANGHAI BEILING
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Problems solved by technology

[0004] In order to solve the problem that the slope of the temperature readout value of the CMOS temperature sensor deviates from the ideal value and cause the accuracy to decrease, the present invention proposes a single-point temperature calibration device and method for an integrated CMOS temperature sensor

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  • Temperature calibration device and method for integrated cmos temperature sensor
  • Temperature calibration device and method for integrated cmos temperature sensor
  • Temperature calibration device and method for integrated cmos temperature sensor

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Embodiment Construction

[0025] The composition structure or steps and working principles of the temperature calibration device and method for CMOS temperature sensors of the present invention will be described in detail below in conjunction with the accompanying drawings and specific embodiments.

[0026] combine image 3 , V BE3 The negative temperature coefficient of the I TRIM change with change. When I TRIM When the voltage becomes large, V BE3 The absolute value of the slope with temperature becomes smaller due to αΔV BE The slope of the straight line is only related to the current ratio of Q1 and Q2. When the current ratio 1: P is constant, αΔV BE The slope of the line is constant, so V REF =V BE3 +αΔV BE The slope of the change with temperature is a positive value, and the temperature readout value of the temperature sensor thus obtained has a slope of less than 1 with the change of temperature. When I TRIM V BE3 The absolute value of the slope with temperature becomes larger due to...

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Abstract

The invention discloses a device and method for single-point temperature calibration of an integrated CMOS temperature sensor. The device includes an integrated CMOS temperature sensor, a data processing unit, a slope register, an intercept register, a temperature value register, a decoder and a current adjustment register. The invention does not need an external voltage source, only needs one temperature test point to improve the temperature calibration accuracy, has high calibration speed, and does not increase peripheral circuits, thus greatly reducing the test cost.

Description

technical field [0001] The invention relates to an integrated CMOS temperature sensor, more specifically, a temperature calibration device and method for an integrated CMOS temperature sensor. Background technique [0002] Such as figure 1 As shown, the integrated CMOS temperature sensor uses parasitic PNP transistors Q1, Q2 and Q3 in the CMOS process as temperature sensing elements to generate V BE3 and ΔV BE (V BE2 -V BE1 ) two temperature-dependent voltage signals, which are used to generate V BE3 voltage current is adjustable current I TRIM , V BE3 The voltage decreases with the increase of temperature and has a negative temperature characteristic; ΔV BE The voltage is generated by two PNP tubes with a bias current of 1:P, ΔV BE It increases with increasing temperature and has a positive temperature coefficient. combine figure 2 , the readout value of temperature T OUT A variable αΔV that is linearly related to temperature can be used BE (V PTAT ) relative ...

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01K15/00
Inventor 李鹏丁学欣
Owner SHANGHAI BEILING
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