Multi-section cable type measuring electrode of admittance or capacitance level meter

Abstract

The invention relates to a multi-section cable type measuring electrode of an admittance or capacitance level meter. The multi-section cable type measuring electrode of the admittance or capacitance level meter comprises a plurality of shielded conductors, a first insulating layer arranged on the periphery of the shielded conductors, a metal shielding layer arranged on the periphery of the first insulating layer, and a second insulating layer arranged on the periphery of the metal shielding layer, wherein the metal shielding layer is of a sectioned structure, the sections of the metal shielding layer correspond to the shielded conductors in a one-to-one mode, and each section of the metal shielding layer serves as an independent measuring electrode and is electrically connected with the corresponding shielded conductor. The multi-section cable type measuring electrode of the admittance or capacitance level meter has the advantages that as a flexible structure is adopted to replace a rigid structure, the weight of a sensor is reduced; the multi-section cable type measuring electrode of the admittance or capacitance level meter is suitable for measuring the material level of liquid and slurry materials, and can be suitable for measuring the material level of solid materials after a flexible protective device is additionally arranged on the periphery of the electrode; the multi-section cable type measuring electrode is used in cooperation with an intelligent multi-channel admittance (capacitance) transducer so that the changes of physical properties of the materials can be automatically tracked, and automatic calibration can be achieved; the performance of external environment interference resistance and high measurement precision are improved.

Description

technical field [0001] The invention belongs to the field of measurement, in particular to a multi-segment cable-type measuring electrode of an admittance or capacitance level meter. Background technique [0002] Using radio frequency admittance technology to measure the height of materials is a common sensing measurement method at present. The existing radio frequency admittance level gauge has the advantages of simple structure and convenient debugging, and is widely used at home and abroad. The radio frequency admittance level gauge in the patent US005701084A requires the dielectric coefficient of the measured material to be constant during use, but in actual measurement, the dielectric coefficient of the material usually changes with physical parameters such as temperature, pressure, and density, so the application process , requires personnel to frequently adjust the parameters of the measurement circuit according to the state of the material. [0003] In order to solv...

AI Technical Summary

Problems solved by technology

[0004] The invention proposes a multi-segment cable-type measuring electrode of an admittance or capacitance level gauge, which can be combined with an intelligent multi-channel admittance or capacitance transmitter to form an intelligent level gauge, which solves the problem of the traditional radio frequency admittance level gauge The problem that automatic calibration cannot be realized when the dielectric constant changes; solves the problem of bulky structure and difficult transportation and installation of the steel pipe segmented radio frequency admittance or capacitance level gauge sensor; solves the previous steel pipe segmented radio frequency admittance or capacitance level sensor When the level meter measures solid materials, the sensor is easily bent and deformed to cause damage, which significantly improves the service life of the sensor; it solves the problem of direct contact between the steel pipe and the material when the steel pipe segmented radio frequency admittance or capacitance level meter measures solid materials. Electrostatic interference, and the problem of material corrosion sensor; solve the problem that the measurement signal is inconsistent, unstable and affect the measurement accuracy caused by the inconsistency of the electrode structure size of each section of the segmented radio frequency admittance level gauge or capacitance level gauge. Make up for the deficiencies in the existing technology

Images