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Multi-channel configurable isolated scanning a/d module

A multi-channel, channel technology, used in simulators, general control systems, control/regulation systems, etc., can solve problems such as poor versatility, measurement failure, and small number of channels, and achieve improved accuracy, flexible settings, and guaranteed safety. Effect

Active Publication Date: 2015-10-28
HARBIN INST OF TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] The purpose of the present invention is to solve the problem that the traditional A / D acquisition module has a small number of channels, poor versatility and measurement failure due to the existence of common mode voltage between systems, and proposes a multi-channel configurable and isolated scanning A / D module

Method used

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specific Embodiment approach 1

[0040] Specific implementation mode one: combine figure 1 Describe this embodiment mode, the multi-channel configurable isolated scanning A / D module described in this embodiment mode, it comprises first 128 road matrix switch circuits, isolation circuit, second 128 road matrix switch circuits, AD acquisition circuit and VXI bus ;

[0041] The first 128-way matrix switch circuit has 64 input terminals and 128 output terminals;

[0042] The second 128-way matrix switch circuit has 128 input terminals and 64 output terminals;

[0043] The 64-way signal input terminals of the first 128-way matrix switch circuit are used to input 64-way differential signals,

[0044] The 64 road signal output terminals in the 128 road signal output terminals of the first 128 road matrix switch circuit circuit are respectively connected with the 64 road isolation input terminals of the isolation circuit, the 64 road isolation output terminals of the isolation circuit and the first 128 road matrix ...

specific Embodiment approach 2

[0048] Specific implementation mode two: combination figure 1 Describe this implementation mode. This implementation mode is a further limitation of the multi-channel configurable and isolated scanning A / D module described in the first specific implementation mode. The AD acquisition circuit includes a DSP chip, a FIFO module, an SDRAM module, a register bank, and a transmission FIFO module, FLASH module, AD module, control logic module, channel selection module and 64 filter circuits;

[0049] The 64-way signal output terminals of the second 128-way matrix switch circuit are connected with the 64-way filter signal input terminals of the 64-way filter circuit;

[0050] The 64-way filter signal output terminals of the 64-way filter circuit are connected with the 64-way filter signal input terminals of the channel selection module,

[0051]The channel control selection signal output terminal of the control logic module is connected with the channel control selection signal inpu...

specific Embodiment approach 3

[0065] Specific implementation mode three: combination figure 2 This implementation mode is described. This implementation mode is a further definition of the multi-channel configurable and isolated scanning A / D module described in the first specific implementation mode. The control logic module includes an A / D scanning control logic module and a FIFO buffer control logic module;

[0066] The A / D scanning control logic module is used to select an arbitrary sequence scanning mode or a sequential scanning mode according to the input signal, and perform channel scanning according to the selected scanning mode, and generate A / D acquisition timing, and send the timing to AD module;

[0067] The sequential scanning method is to scan the channels sequentially according to the order of the channels;

[0068] The random order scanning method is to scan the channels according to the parameters selected by the channel control of the DSP chip input;

[0069] The FIFO cache control log...

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Abstract

The invention provides a multichannel configurable isolated scanning A / D module and relates to A / D modules. The multichannel configurable isolated scanning A / D module aims at solving the problems that a traditional A / D collection module is small in number of channels and poor in universality and a fault occurs in the measurement process due to the fact that common mode voltage exists among systems. The multichannel configurable isolated scanning A / D module comprises a first 128-path matrix switch circuit, an isolation circuit, a second 128-path matrix switch circuit, an AD collection circuit and a VXI bus. The first 128-path matrix switch circuit, the isolation circuit and the second 128-path matrix switch circuit are connected so that a 64-path non-isolation scanning channel and an isolation scanning channel isolated from the 64-path non-isolation scanning channel can be formed, and therefore an isolation channel or a non-isolation channel is arranged for a 64-path differential input signal. A 64-path signal output terminal of the second 128-path matrix switch circuit is connected with a 64-path signal collection input terminal of the AD collection circuit. A signal collection output terminal of the AD collection circuit is connected with the VXI bus. The multichannel configurable isolated scanning A / D module is used for scanning the A / D module in an automatic testing system.

Description

technical field [0001] The invention relates to an A / D module, in particular to a multi-channel configurable and isolated scanning A / D module. Background technique [0002] The scanning A / D module is a commonly used component in an automatic test system, and is mainly used to collect a large number of analog signals in the device under test. For various new automatic test systems, in order to avoid the mutual influence of the automatic test system on the equipment under test, the equipment under test is required to be isolated from the automatic test system, which makes each input channel of the scanning A / D module in the automatic test system and A non-common ground differential connection is formed between the tested signals, and this connection often generates a large common-mode voltage between the automatic test system and the device under test due to AC induction, leakage, static electricity accumulation, etc., and the common-mode voltage is superimposed If the measur...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G05B19/042
Inventor 孙超刘玉奇姜守达丁雪静
Owner HARBIN INST OF TECH
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