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Thickness detection device and method using digital optical technology

A technology of thickness detection and digital optics, which is applied in the direction of optical devices, measuring devices, optics, etc., can solve problems such as longer detection time, inability to obtain correct information on the thickness of the detection object, and light loss, and achieve the effect of improving detection efficiency

Inactive Publication Date: 2016-05-25
SNU PRECISION CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0006] This conventional invention has the problem of not being able to obtain accurate information on the thickness of the detection object due to light loss when light passes through the LCD.
[0007] Moreover, to obtain the thickness information of a part of the test object, it is necessary to analyze the thickness of the whole test object. If the film structure of each test area of ​​a test object is different, multiple tests are required, which will lead to longer test time. long

Method used

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  • Thickness detection device and method using digital optical technology
  • Thickness detection device and method using digital optical technology
  • Thickness detection device and method using digital optical technology

Examples

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no. 1 example 100

[0062] The beam splitter 150 is a device for detecting the spectrum of light reflected from the detection object 105 . According to the first embodiment 100 of the present invention, the first beam splitter 151 and the second beam splitter 152 are included, but they are not limited thereto, and more than three beam splitters can be configured according to the needs of users.

[0063] Such as Figure 3a As shown, the first beam splitter 151 is arranged on the optical path where the light is reflected at a reflection angle of 100° from the reflective optical path conversion unit 140, and the second beam splitter 152 is arranged on the optical path where the light is reflected from the reflective optical path conversion unit 140 at an angle of 80°. Angle on the reflected light path. However, it is not limited to this angle, as long as each beam splitter 150 is placed on an optical path having a different reflection angle from the reflective optical path conversion unit 140 .

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no. 1 example S100

[0083] The thickness detection step S140 is a step of irradiating the spectrum of light incident on the beam splitter 150 , detecting the reflectance of the light, and measuring the thickness of the detection object 105 based on this. According to the first embodiment S100 of the present invention, the thickness detection step S140 includes a reflectance detection step S141 , a reflectance comparison step S142 and a thickness output step S143 . However, the thickness detection step S140 is not limited to the above steps.

[0084] The reflectance detection step S141 calculates the reflectance of the detection area by analyzing the spectrum of the light incident on the beam splitter and using the light quantity data of each wavelength of the light.

[0085] The reflectance comparison step S142 is a step of searching for a model with the most similar reflectance by comparing the reflectance of the detection area obtained in the reflectance detection step S141 with the reflectance o...

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Abstract

The invention discloses a thickness detection device and method using digital optical technology. The thickness detection device and method using digital optical technology of the present invention include: a light source for emitting light; a beam splitter for reflecting light emitted from the light source or light reflected by the object to be detected; a lens part for It is used to converge the light reflected by the optical beam splitter to the detection object; the reflective optical path conversion part is used to selectively reflect the light transmitted from the optical beam splitter; the beam splitter is used to analyze the light reflected from the reflective optical path conversion part light to obtain the thickness information of the detection object. Therefore, according to the present invention, there is provided a thickness detection device using digital optical technology and a method thereof which can minimize light loss by utilizing light reflection and simultaneously detect the thickness of multiple detection regions.

Description

[0001] technology area [0002] The present invention relates to a thickness detection device and its method using digital optical technology, and in more detail, relates to a reflective optical path conversion part to reflect the light transmitted from the beam splitter, thereby minimizing the loss of light, and passing The invention relates to a thickness detecting device and method thereof which utilize digital optical technology and can simultaneously detect the thickness of multiple locations by adjusting the reflection angle. Background technique [0003] Among the many factors that determine product quality in the semiconductor process and FPD process, the control of the thickness of the film layer accounts for a large proportion, so it must be directly monitored in the process. The "thin film layer" refers to a layer having an extremely fine thickness formed on the base layer, that is, on the surface of a substrate, and generally refers to a layer having a thickness in...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): H01L21/66G02B27/10
CPCG01B11/06G02B27/108H01L22/12G01B11/022G01B11/0608G01B11/0675H01L2225/06596
Inventor 黄映珉赵泰英金侊乐
Owner SNU PRECISION CO LTD