Reliability testing table for multistage tandem chip removing devices
Patent Information
- Authority / Receiving Office
- CN · China
- Current Assignee / Owner
- JILIN UNIV
- Publication Date
- 2014-02-19
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Abstract
Description
technical field
[0001] The invention relates to a test device applied to the reliability field of chip conveyors of numerical control machine tools, more precisely, the invention relates to a device capable of realizing variable speed, variable load loading and reliability tests on chain plate chip conveyors. Multi-stage tandem chip conveyor reliability test bench. Background technique
[0002] CNC machine tools are the basis for improving the national manufacturing level and equipment level, and are an important symbol to measure a country's industrial development level and comprehensive national strength. As a device commonly equipped with CNC machine tools, the chip conveyor is simple in structure but plays an important role in production. Once the chip conveyor fails, it will have a greater negative impact on production work. In recent years, with the development of a series of digital manufacturing equipment such as precision machine tools and high-end CNC machine tool...