Reliability testing table for multistage tandem chip removing devices

A technology of chip conveyor and tandem type, which is applied in the field of multi-stage tandem chip conveyor reliability test bench, can solve the problems of long test period, inability to simulate working conditions, and inability to test multiple chip conveyors

Active Publication Date: 2014-02-19
JILIN UNIV
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0004] The technical problem to be solved by the present invention is that the current chip conveyor reliability test device cannot test multiple chip conveyors at the same time,

Method used

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  • Reliability testing table for multistage tandem chip removing devices
  • Reliability testing table for multistage tandem chip removing devices
  • Reliability testing table for multistage tandem chip removing devices

Examples

Experimental program
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Embodiment Construction

[0030] The present invention is described in detail below in conjunction with accompanying drawing:

[0031] refer to figure 1 , the multi-stage tandem chip conveyor reliability test bench (in this embodiment, a multi-stage tandem chip conveyor reliability test bench formed by connecting three chip conveyors in series) includes a circular chip removal mechanism, a state detection Alarm mechanism and variable speed automatic control mechanism.

[0032] 1. Circular chip removal mechanism

[0033] The circulating chip removal mechanism includes No. 1 chip conveyor 2, No. 2 chip conveyor 10, No. 3 chip conveyor 11, chip collector 7, No. 1 support frame 1, No. 2 support frame 12, and No. 3 support frame 3. Horizontal iron 4, front support block (3 pieces), rear support block (3 pieces), fixed angle steel (6 sets, including bolts, nuts, spring washers); No. 1 support frame 1, No. 2 support frame 12, ground level The front support block and the rear support block are respectively ...

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PUM

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Abstract

The invention discloses a testing device applied to the fields of the reliability of numerically-controlled machine tool chip removing devices and relates to a reliability testing table for multistage tandem chip removing devices. The reliability testing table is mainly composed of a circulating chip removing mechanism, a state detection alarm mechanism and a speed changing automatic control mechanism. The circulating chip removing mechanism is composed of a supporting frame fixed on horizontal iron, more than two chip removing devices fixed on the horizontal iron or the supporting frame, and a chip collecting device fixed on the supporting frame. The state detection alarm mechanism is composed of a light curtain sensor, a vibration sensor, an A/D card and a signal amplifier. The speed changing automatic control mechanism is composed of an upper industrial control computer, a lower programmable logic controller (PLC), a frequency changer, a control cabinet and a control panel arranged in the control cabinet. The reliability testing table for the multistage tandem chip removing devices can simulate different working conditions, is capable of alarming failures, can conduct reliability loading tests on chip removing devices different in model and number as long as an installing part is adjusted, and has flexibility and universality.

Description

technical field [0001] The invention relates to a test device applied to the reliability field of chip conveyors of numerical control machine tools, more precisely, the invention relates to a device capable of realizing variable speed, variable load loading and reliability tests on chain plate chip conveyors. Multi-stage tandem chip conveyor reliability test bench. Background technique [0002] CNC machine tools are the basis for improving the national manufacturing level and equipment level, and are an important symbol to measure a country's industrial development level and comprehensive national strength. As a device commonly equipped with CNC machine tools, the chip conveyor is simple in structure but plays an important role in production. Once the chip conveyor fails, it will have a greater negative impact on production work. In recent years, with the development of a series of digital manufacturing equipment such as precision machine tools and high-end CNC machine tool...

Claims

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Application Information

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IPC IPC(8): G01M99/00
Inventor 陈菲杨兆军段炜何佳龙田海龙王松蒋敬仁焦大蒙马宇鹏张良
Owner JILIN UNIV
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