Image locating control dual-probe automatic testing device based on midpoint tracking

Abstract

An image locating control dual-probe automatic testing device based on midpoint tracking comprises a carrying table, two probe supports, a main control computer, a subdivision driver, a three-axis stepping motor and a camera. The subdivision driver drives a testing head assembly provided with the probe supports to rotate in the horizontal plane, the three-axis direction stepping motor drives the testing head assembly to move in the three-axis directions, the camera is arranged above the carrying table, the shooting direction of the camera faces downwards, and the testing head assembly is provided with a third driving mechanism driving the first probe support and the second probe support to carry out horizontal mirror image movements. According to the image locating control dual-probe automatic testing device based on the midpoint tracking, the automatic locating of dual probes is achieved by using image locating control technology to carrying out midpoint tracking of test points, the automatic locating testing of two test points of a sample is achieved, the labor intensity of testing personnel is reduced greatly, and the testing accuracy is improved. The locating mode is novel, the rotating type testing head assembly and the movable openable type dual probes are used ingeniously, the probes can be accurately located to any two test points of the sample to be tested, and thus the dual-probe automatic testing device can meet testing demands.

Description

technical field [0001] The invention relates to an image positioning control dual-probe automatic testing device based on midpoint tracking. Background technique [0002] The probe station is a very important test platform for scientific research institutes and enterprises conducting research and production of electronic components. Probe test benches can be classified into single-probe, double-probe and multi-probe test benches according to the number of their probes. Among them, the double-probe test bench has become the most widely used probe station because it meets the basic current-voltage, capacitance-voltage and other test functions. At present, the double-probe test bench is mainly divided into two types: manual and automatic. The positioning of the probes of the manual test bench is mainly carried out by human visual observation. For smaller test points, due to the obstruction of the probe to the vision, it is difficult to locate the probe, which causes poor con...

AI Technical Summary

Problems solved by technology

For smaller test points, due to the obstruction of the probe to the vision, it is difficult to locate the probe, which makes the probe have poor contact and increases the contact resistance, which will cause inaccurate test results.

However, the existing automatic test platform cannot realize the flexible movement of the probe because it is aimed at the regular products of the enterprise, and does not have the ability to test irregular samples and fragments. For products of different specifications on the same production line, multiple test platforms are required. , increase production cost and reduce production efficiency

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