Color film substrate repairing method

A color filter substrate and defect technology, applied in nonlinear optics, instruments, optics, etc., can solve the problem of over-grinding of color filter substrates

Inactive Publication Date: 2014-03-26
HEFEI BOE OPTOELECTRONICS TECH +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

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Problems solved by technology

[0005] The technical problem to be solved by the present invention is: how to s

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  • Color film substrate repairing method
  • Color film substrate repairing method
  • Color film substrate repairing method

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Embodiment Construction

[0045] The specific implementation manners of the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. The following examples are used to illustrate the present invention, but are not intended to limit the scope of the present invention.

[0046] figure 1 It is a flow chart of a method for repairing a color filter substrate provided in an embodiment of the present invention, including:

[0047] Step S1: capturing the image of the color filter substrate;

[0048] Specifically, the defect on the color filter substrate can be used as a target area, and a normal pattern (pattern) can be used as a background area to acquire an image of the color filter substrate.

[0049] Step S2: performing grayscale processing on the image;

[0050] Step S3: extracting defect areas in the image according to the gray value of the image;

[0051] Step S4: detecting the edge of the defective area;

[0052] Step S5: Perform bl...

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Abstract

The invention provides a color film substrate repairing method. The color film substrate repairing method comprises the steps of capturing a color film substrate image; performing graying treatment on the image; extracting a defect region from the image according to a gray value of the image; detecting the edge of the defect region; performing blocking treatment on the defect region according to the edge of the defect region to obtain sub-defect regions in the defect region; selecting grinding points from the sub-defect regions to performing grinding. The defects in a color film substrate are divided into a plurality of portions, then the portions are respectively subjected to height measurement and grinding, and accordingly the problem that large-sized defect points are grinded is solved.

Description

technical field [0001] The invention relates to the display field, in particular to a method for repairing a color filter substrate. Background technique [0002] With the development of optoelectronic technology and semiconductor manufacturing technology, liquid crystal displays have completely replaced traditional CRT displays and become the mainstream of display devices by virtue of their advantages of thinness and portability. The liquid crystal layer filled between the substrate and the color filter substrate, the light emitted by the backlight is modulated by the liquid crystal molecules and enters the color filter substrate, and passes through the red color resistance, green color resistance and blue color resistance of the color filter substrate. Displays red, green and blue light. The color filter substrate is the main device used to realize color display. However, in the production process of the color filter substrate, it is inevitable that various defects will b...

Claims

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Application Information

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IPC IPC(8): G02F1/13
Inventor 李启明张明文吴斌李晶晶李朝阳崔秀娟李娟
Owner HEFEI BOE OPTOELECTRONICS TECH
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