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A method, system and device for detecting spacers

A technology of spacers and infrared rays, which is applied in the direction of measuring devices, optical devices, optics, etc., can solve the problems of complex detection equipment, inability to detect the connection of spacers, and slow detection speed, etc.

Inactive Publication Date: 2016-06-01
HEFEI BOE OPTOELECTRONICS TECH +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0003] If the spacer cannot return to its original shape after being subjected to uneven force or external force, the substrates above and below the spacer are likely to shift, resulting in white defects in the display. Therefore, it is necessary to check the spacer. Detection to make adjustments to liquid crystal dispensing based on measured spacer thickness for better control of cell thickness
In the prior art, the detection of spacers is mainly to obtain images of spacers through a CCD (Charge-coupled Device, ie charge-coupled device) lens, and then detect unqualified spacers according to the gray value, but the detection accuracy The detection speed is not high, and the detection speed is relatively slow. Since the CCD lens captures the image under visible light, it is impossible to detect the internal structure of the spacer and the connection between it and the color filter substrate. The interior and elastic modulus of the object cannot be measured, so after orientation and cell alignment, the thickness of the liquid crystal cell is not necessarily the optimal cell thickness
In addition, the current detection equipment is complicated, and the marble machine and the lower anti-vibration table are used, and a high anti-vibration coefficient is required, that is, the requirements for detection conditions are relatively high.
[0004] Therefore, the equipment and method for detecting spacers in the prior art lead to inaccurate measurement results, which affects the quality of liquid crystal displays, the optical system is very complicated, and the equipment maintenance costs are large.

Method used

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  • A method, system and device for detecting spacers
  • A method, system and device for detecting spacers
  • A method, system and device for detecting spacers

Examples

Experimental program
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Effect test

Embodiment 1

[0050] A method for detecting a spacer is provided in the first embodiment, and the steps are as follows: image 3 As shown, it specifically includes the following steps:

[0051] Step S1 , multiple sub-light sources emit infrared rays with different wavelengths and the same light intensity at non-overlapping timing, and the infrared rays are irradiated on the spacer.

[0052] Step S2, collecting infrared images formed by infrared rays of different wavelengths reflected back by the spacer in time division.

[0053] Step S3. Accumulate and calculate the light intensity of each pixel in the infrared image collected with different wavelengths to obtain the total light intensity of the entire image.

[0054] Step S4, comparing the total light intensities calculated at different wavelengths, and calculating the distance between the spacers according to the infrared image corresponding to the maximum value of the total light intensity.

[0055] The above-mentioned detection method...

Embodiment 2

[0066] Embodiment 2 of the present invention also provides a system for detecting spacers, the schematic diagram of which is shown in Figure 4 shown, including:

[0067] A light source 1, an imaging unit 2, a control unit 3, a light intensity accumulation unit 4, and a comparison calculation unit 5, wherein the light source 1 provides a plurality of sub-light sources, and emits infrared rays with different wavelengths and the same light intensity at non-overlapping timing; the imaging unit 2 is used for time-sharing collection of infrared images formed by infrared rays of different wavelengths reflected by the spacer; the control unit 3 is connected with the light source 1 and the imaging unit 2, and controls the multiple sub-light sources of the light source 1 to emit at different times Infrared rays with the same light intensity, and control the imaging unit 2 to collect infrared rays of different wavelengths reflected back; the light intensity accumulation unit 4 is connec...

Embodiment 3

[0084] Embodiment 3 of the present invention also provides a device for detecting spacers, the schematic diagram of which is shown in Figure 5 shown, specifically including the abutment, Figure 5Not shown in the figure, the base platform is also provided with a horizontal guide rail 11, a vertical guide rail 12 and an infrared camera tube 13, wherein the infrared camera tube 13 is installed on the vertical guide rail 12 and also moves in the vertical direction along the vertical guide rail 12, specifically, The infrared camera tube 13 is sleeved on the vertical guide rail 12, and the two ends of the vertical guide rail 12 slide horizontally on the horizontal guide rail 11, thereby realizing the omnidirectional scanning of the color film substrate by the infrared camera tube 13. The infrared camera tube 13 is The imaging unit in the system for detecting spacers described in the second embodiment.

[0085] Preferably, the device in this embodiment also includes an electric cy...

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Abstract

The invention discloses a spacer detection method, system and device. The method includes the steps that a plurality of secondary light sources emit infrared rays different in wavelength and same in light intensity in a non-overlapped time sequence, and the infrared rays are shorn on spacers; infrared images formed by different wavelengths of infrared rays reflected by the spacers are collected in a time division mode; the light intensities of all the pixel points in the infrared images collected through different wavelengths are accumulated to obtain the total intensities of the whole images; the total light intensities obtained through calculation at different wavelengths are compared, and the distance between the spacers is calculated according to the infrared image corresponding to the largest total intensity. Infrared scanning is performed on the spacers on the basis of the infrared distance measurement principle, and the infrared rays reflected by the spacers in different positions are assembled to form the infrared images of a full color film substrate. The method is favorable for measurement of the box thickness of the spacers, a liquid crystal instilling machine is adjusted according to the spacer measurement data, the box thickness can be controlled better, and the display effect of a liquid crystal screen is improved.

Description

technical field [0001] The invention relates to the field of display technology, in particular to a method, system and device for detecting spacers. Background technique [0002] A liquid crystal display is a commonly used flat panel display, and a thin film transistor liquid crystal display (Thin Film Transistor-Liquid Crystal Display, TFT-LCD for short) is a mainstream product in the liquid crystal display. TFT-LCD generally includes an array substrate (TFT substrate) and a color filter substrate (CF substrate) arranged in opposite cells, and a liquid crystal layer is filled between the array substrate and the color filter substrate. At the same time, a spacer is provided between the array substrate and the color filter substrate, and the spacer will support the thickness of the array substrate and the color filter substrate. The spacer is an important part of the liquid crystal display, and the height of the spacer determines the amount of liquid crystal that needs to be...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G02F1/13G01B11/14G01B11/06
Inventor 井杨坤林晓华
Owner HEFEI BOE OPTOELECTRONICS TECH