Systems and methods for providing voltage supply protection in memory devices

Abstract

The present invention relates to systems and methods for providing voltage supply protection in memory devices. The present invention relates to electronic storage systems, and more particularly, to a system for providing voltage supply protection in a memory device, and a method for providing voltage supply protection in a memory device. According to an embodiment, there is provided a system for providing voltage supply protection in a memory device, the system comprising a memory array comprising a plurality of memory cells arranged in groups of memory cells and a plurality of current limiting elements, Therein, each group of memory cells is associated with at least one current limiting element.

Description

technical field [0001] The present invention relates generally to electronic storage systems, and more particularly to systems for providing voltage supply protection in memory devices, and methods for providing voltage supply protection in memory devices. Background technique [0002] In many applications, such as those employing microcontrollers, high reliability memory devices, especially non-volatile memory devices, are required. For example, in the automotive sector, as the number of microcontrollers included in modern motor vehicles is increasing, the need for such memory systems is constantly increasing. For such a variety of purposes, these microcontrollers are used as engine and transmission control, advanced driver assistance systems or infotainment systems. All of these applications require memory to function. Because many of these applications involve safety-related aspects, highly reliable memories are required. In addition, such high-quality storage systems ...

AI Technical Summary

Problems solved by technology

[0007] Since a nonvolatile memory such as a flash memory is a semiconductor device whose array has a large number of microstructures, it is not always possible to avoid a single failure such as a single failure in the memory cell array that evolves only during chip operation

However, a fault in the memory array can result in a low impedance path on the high ohmic terminals, leading to catastrophic failure of the entire memory array

In particular, if the non-volatile memory device includes a voltage supply, such a low impedance path can cause the wrong voltage to be supplied to the memory array

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