Open-circuit and short-circuit test device and test method for chip pins

Abstract

The invention provides an open circuit short circuit test device and an open circuit short circuit test method of a chip base pin. The test device comprises at least one test board card, wherein a main control chip group and a base pin measuring unit array are arranged on each test board card, the base pin measuring unit array receives control signals output by the main control chip group and comprises a plurality of base pin measuring units, a channel switching switch array is also arranged on the test board card, the channel switching switch array comprises a plurality of channel switching switch units, a channel interface is also formed in the test board card, the channel interface comprises a plurality of test passages, each channel switching switch unit can be used for switching more than two test passages for testing, and the test passages of one base pin measuring unit are switched by each channel switching switch unit. The test method belongs to a method for testing the base pin of a chip by adopting the method. The device and the method provided by the invention have the advantages that the base pin of the chip can be fast tested, in addition, the size of the test device is small, and the test cost is low.

Description

technical field [0001] The invention relates to the field of chip testing, in particular to a device for testing chip pins for open and short circuits and a testing method using the testing device. Background technique [0002] Existing electronic equipment integrates a large number of electronic chips, and each chip usually has multiple pins. After the chip is packaged on the printed circuit board, it is electrically connected to the circuit on the printed circuit board through the pins, so the electrical performance of the pins has a great influence on the work of the chip. Usually, after the chip is produced, each pin of the chip needs to be tested to judge the electrical performance of the pin. The most common test is to detect the open-short condition of each pin, which is usually called an open-short test (Open-Short Test). [0003] The open-circuit short-circuit test is also called the continuity test (Continuity Test) or the contact test (Contact Test), which is us...

AI Technical Summary

Problems solved by technology

However, its disadvantage is that the result information displayed by the data register is limited. When the test pin 12 has an open circuit or a short circuit, it is usually impossible to directly determine the specific pin and its cause of failure.

[0010] Since the chip to be tested has multiple pins, a common chip has 256 pins, because the existing test device needs to test 256 pins at the same time, and one pin is required for testing each pin Measurement unit or PE board, which leads to the large size of the existing test device, too many pin measurement units, and high test cost, which cannot realize low-cost test of the chip

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