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Correction method for poor image elements

A technology of bad pixels and images, applied in the field of correction of bad pixels, can solve the problems of inability to accurately restore the spectral information of ground objects, different, not considering bad pixels, etc., to reduce interference data distortion, improve interpolation accuracy, improve The effect of spectral restoration accuracy

Active Publication Date: 2014-04-16
BEIHANG UNIV
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Problems solved by technology

This method does not take into account the different influences of the two directions of the spatial dimension, and the weights should be different when weighting; it also does not consider that when bad pixels appear in different positions of the spectral dimension, the weight factors of the spectral dimension and the spatial dimension are different, and the ground objects cannot be accurately restored spectral information

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  • Correction method for poor image elements
  • Correction method for poor image elements

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Embodiment Construction

[0021] The present invention will be described in further detail below in conjunction with specific embodiments.

[0022] The present invention is a method for correcting bad pixels of data based on space-time joint modulation interference imaging spectrometer, such as figure 1 shown, including the following steps:

[0023] Step 1: From the laboratory and actual calibration data, obtain the positions of all bad pixels in the space-time joint modulation interferometric imaging spectrometer;

[0024] In the space-time joint modulation interferometric imaging spectrometer, the bad pixel is caused by the defect of the instrument itself. If there is a bad pixel, the coordinates of the bad pixel on the obtained image are fixed. So the location of all bad pixels can be determined by laboratory calibration.

[0025] Step 2: Obtain an image containing the target object point of interest through a space-time joint modulation interferometric imaging spectrometer, that is, a push-broom...

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Abstract

The invention discloses a correction method for poor image elements of a space and time united modulating type interference imaging spectrometer. The correction method for the poor image elements comprises step one, obtaining positions of all poor image elements in the space and time united modulating type interference imaging spectrometer; step two, obtaining images which comprise interested target ground feature points through the space and time united modulating type interference imaging spectrometer; step three, generating into a data cube due to data processing; step four, confirming poor point positions; step five, obtaining data cube data of an area in which interested ground features are arranged and performing interpolation correction on poor image element positions; step six, recovering to obtain spectrums of the interested target ground feature points. The correction method for the poor image elements integrates data of the space and time united modulating type interference imaging spectrometer into the three-dimensional data cube, fully utilizes two space dimension and one spectrographic dimension datum, improves the interpolation accuracy of the poor image elements and weakens extracted interference data distortion of the interested target points.

Description

technical field [0001] The invention relates to a method for correcting bad picture elements, which belongs to the technical field of signal processing. Background technique [0002] As a new type of imaging spectrometer, the space-time joint modulation interferometric imaging spectrometer overcomes the shortcomings of the poor stability of the time-modulating interferometric imaging spectrometer and the low throughput of the spatial modulation interferometric imaging spectrometer, and has multiple channels, higher luminous flux, and better spectrum. And spatial resolution and other advantages, in the past ten years, it has gradually attracted the attention of various countries and developed maturely. The space-time joint modulation interferometric imaging spectrometer scans the target scene in a push-broom manner, and the target is imaged at different positions of the detector at different times. In this way, the complete point interferogram of the target point is obtained...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01J3/45
Inventor 袁艳苏丽娟操俊
Owner BEIHANG UNIV
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