Automated testing platform for embedded device

An automated testing and platform technology, applied in the direction of software testing/debugging, etc., can solve the problems of increased cost and poor versatility of automated testing, and achieve the effect of reducing burden, good data structure foundation, and convenient data statistics

Active Publication Date: 2014-04-16
XIAN ZHONGLANG AL TECH CO LTD
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The technical problem to be solved by the present invention is to provide a highly versatile automated testing platform for embedded devices in order to overcome the defects of the existing technology, such as the unavoidable increase in cost and the poor versatility of automated testing when there are many test cases

Method used

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  • Automated testing platform for embedded device
  • Automated testing platform for embedded device
  • Automated testing platform for embedded device

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Embodiment Construction

[0039] The present invention is further illustrated below by means of examples, but the present invention is not limited to the scope of the examples.

[0040] refer to figure 1 , the automated test platform for embedded devices according to the present invention includes a plurality of subsystems, and a holographic tree 6 is used to realize communication and data sharing among the plurality of subsystems. The holographic tree adopts the data structure of XML DOM, and the plurality of subsystems The system includes a script subsystem 1, an instrument subsystem 2, a user subsystem 3, a log subsystem 4 and a display subsystem 5, and the holographic tree 6 includes a script / log subtree, an instrument subtree, and a user subtree ,in,

[0041] The script subsystem 1 is used to execute test scripts, collect test results, generate original log nodes, and construct and maintain the script / log subtree according to test results;

[0042] The instrument subsystem 2 is used for maintain...

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Abstract

The invention discloses an automated testing platform for an embedded device. The automated testing platform for the embedded device comprises a plurality of subsystems. Communication and data sharing can be achieved among the subsystems through a holographic tree. The subsystems comprise the script subsystem, the instrument subsystem, the user subsystem, the log subsystem and the display subsystem. The script subsystem is used for executing a testing script, collecting a testing result, generating an original log node and establishing and maintaining the script / log subtree according to the testing result. The instrument subsystem is used for maintaining the instrument subtree and synchronous remote instrument information. The user subsystem is used for completing establishment of the user subtree and continuous updating of the user subtree. The log subsystem is used for establishing a pure log tree independent of the holographic tree according to the script subtree and the log subtree. The display subsystem is used for reading all the subtrees in the holographic tree so as to complete establishment of an interface of each corresponding subsystem. The established platform has good universality in the testing field of route switching equipment.

Description

technical field [0001] The invention relates to an automatic test platform for embedded equipment, in particular to an automatic test platform for routing and switching equipment. Background technique [0002] The main challenges facing testing software today are: customers want more software features, faster delivery, cheaper cost, and at the same time, better software quality, if not more than their expectations, but at least meet deadline. [0003] This means that the software testing team has great responsibilities, and more functions mean that the software baseline for each test is larger and more complex. Therefore, for a product development, more test cases need to be delivered, but the "faster delivery speed" requirements, so that the test department does not have more time to complete all tests. In order to speed up the testing process, if more manpower is invested, such as increasing the number of testing engineers, it will inevitably increase the testing cost. ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F11/36
Inventor 张鑫
Owner XIAN ZHONGLANG AL TECH CO LTD
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