Looking for breakthrough ideas for innovation challenges? Try Patsnap Eureka!

Single particle latch monitoring method and apparatus of FPGA

A single event latch and reconfiguration technology, applied in the field of testing, can solve problems such as excessive current and device damage

Active Publication Date: 2014-05-07
BEIJING SHENGTAOPING TEST ENG TECH RES INST
View PDF6 Cites 16 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The invention mainly solves the technical problem that the device may be permanently damaged due to excessive current when monitoring the FPGA SEL in the prior art

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Single particle latch monitoring method and apparatus of FPGA
  • Single particle latch monitoring method and apparatus of FPGA

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0028] The specific implementation manners of the present invention will be further described in detail below in conjunction with the accompanying drawings and embodiments. The following examples are used to illustrate the present invention, but are not intended to limit the scope of the present invention.

[0029] figure 1 It is the FPGA SEL monitoring flowchart of the present invention, and its realization process is as follows:

[0030] Step S101, building a test system to ensure that the system communicates normally and works normally. Ensure that the FPGA core voltage, operating voltage, I / O voltage, and phase-locked loop (PLL) voltage are all set to the rated operating voltage, and adjust the fluence rate, irradiation area, and uniformity of the heavy ion beam to meet the requirements. According to the specifications, heavy ion beams with different LET values ​​can be used for irradiation experiments.

[0031] Step S102, using a computer-controlled programmable power ...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

PUM

No PUM Login to View More

Abstract

The invention discloses a single particle latch monitoring method and apparatus of an FPGA. The method specifically comprises the following steps: using a heavy ion beam flow to irradiate the FPGA, monitoring the working current of the FPGA, and when the working current exceeds a specified value, performing reconfiguration on the FPGA; if the reconfiguration fails, performing power-off restarting on the FPGA, and reloading a program; and if program reloading succeeds, recording a single particle latch for once. By using the method provided by the invention, the working current of a device can be monitored in real time, the determination of an FPGA single partial latch is facilitated, at the same time, since a programmable power supply controlled by a computer is employed, a tested device can be protected.

Description

technical field [0001] The invention relates to the technical field of testing, in particular to a monitoring method and device for a single-event latch of an SRAM FPGA irradiated by heavy ions. Background technique [0002] In satellite and space environments, more and more SRAM (Static Random Access Memory) FPGAs (Field-Programmable Gate Arrays) are used. The main single event effects that may occur in SRAM FPGA (hereinafter referred to as FPGA) in the space environment include: single event latch-up (SEL), single event upset (SEU), single event suspension of function (SEFI), etc. In response to such space radiation effects, NASA (National Aeronautics and Space Administration), ESA (European Space Agency) and other institutions have carried out a large number of experiments. Experiments have shown that single event latch-up will increase the FPGA current and local temperature, sometimes even as high as 200°C. If the FPGA is in a high temperature state for a long time, it ...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to View More

Application Information

Patent Timeline
no application Login to View More
Patent Type & Authority Applications(China)
IPC IPC(8): G01R31/317G01R19/00
Inventor 王群勇冯颖阳辉陈冬梅陈宇刘燕芳白桦
Owner BEIJING SHENGTAOPING TEST ENG TECH RES INST
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Patsnap Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Patsnap Eureka Blog
Learn More
PatSnap group products

Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.

© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com