Single particle or single molecule tracking device and method based on atomic force microscope
An atomic force microscope, single-molecule technology, used in measurement devices, scanning probe microscopy, instruments, etc., can solve problems such as the inability to directly and objectively study the dynamic process of the cell surface.
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[0026] The inventive idea of the present invention is: the single-particle or single-molecule tracing device and tracing method based on the atomic force microscope of the present invention, after the needle insertion is completed under the control of the feedback system, a control point is set to make the AFM probe (atomic force microscope) Probe) is in contact with the surface of the measured object with a constant force (<10pN), and the deflection voltage of the probe will produce a deviation compared with the set control point. This deviation signal is sent to the feedback system, which will adjust the position of the scanner piezo to ensure that the probe voltage is consistent with the set control point. When a single particle or single molecule moves downward under force, the microcantilever of the AFM probe will deflect, and then the piezoelectric ceramics of the AFM scanner will elongate. The telescopic distance of electroceramic varies with time. The invention avoi...
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