Single particle or single molecule tracking device and method based on atomic force microscope

An atomic force microscope, single-molecule technology, used in measurement devices, scanning probe microscopy, instruments, etc., can solve problems such as the inability to directly and objectively study the dynamic process of the cell surface.

Active Publication Date: 2014-05-14
CHANGCHUN INST OF APPLIED CHEMISTRY - CHINESE ACAD OF SCI
View PDF2 Cites 13 Cited by
  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] The above-mentioned AFM single-molecule force spectroscopy method has certain defects in the study of the interaction between single particles and cells. During the experiment, the AFM probe is driven by the piezoelectric ceramic scanner to move toward the cell surface in the Z direction, and the cell surface Dynamic processes on the surface, such

Method used

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
View more

Image

Smart Image Click on the blue labels to locate them in the text.
Viewing Examples
Smart Image
  • Single particle or single molecule tracking device and method based on atomic force microscope
  • Single particle or single molecule tracking device and method based on atomic force microscope
  • Single particle or single molecule tracking device and method based on atomic force microscope

Examples

Experimental program
Comparison scheme
Effect test

Embodiment Construction

[0026] The inventive idea of ​​the present invention is: the single-particle or single-molecule tracing device and tracing method based on the atomic force microscope of the present invention, after the needle insertion is completed under the control of the feedback system, a control point is set to make the AFM probe (atomic force microscope) Probe) is in contact with the surface of the measured object with a constant force (<10pN), and the deflection voltage of the probe will produce a deviation compared with the set control point. This deviation signal is sent to the feedback system, which will adjust the position of the scanner piezo to ensure that the probe voltage is consistent with the set control point. When a single particle or single molecule moves downward under force, the microcantilever of the AFM probe will deflect, and then the piezoelectric ceramics of the AFM scanner will elongate. The telescopic distance of electroceramic varies with time. The invention avoi...

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

PUM

No PUM Login to view more

Abstract

The invention relates to a single particle or single molecule tracking device and method based on an atomic force microscope. The tracking method comprises the following steps that before tracking measurement of a single particle or a single molecule is conducted, the point of a probe of the atomic force microscope is trimmed with a detection object; in the process of tracking measurement, the probe of the atomic force microscope makes contact with the surface of a detected object with constant force; when the detection object and the detected object act to each other, a micro cantilever deflects, and the telescopic distance of piezoelectric ceramics of a scanner is changed; a data acquisition card is used for collecting the changes over time of the deflection of the micro cantilever and the changes over time of the telescopic distance of the piezoelectric ceramics, so that the single particle or the single molecule is tracked. The single particle or single molecule tracking method based on the atomic force microscope can be applied to a study on the dynamic process of cell endocytosis viruses, nano particles and other particles, and is also suitable for a study on the transfer process of glucose, amino acid and other small biological molecules on cytomembrane.

Description

technical field [0001] The invention relates to the technical field of microscopic particle track measurement methods, in particular to an atomic force microscope-based single-particle or single-molecule tracing device and tracing method. Background technique [0002] The study of the interaction mechanism between biomolecules at the single-molecule level is of great significance for the in-depth understanding of the specific recognition of biomolecules, biochemical processes, and the relationship between molecular structure and function, and has become an important research field in the interdisciplinary fields of biology, chemistry, and physics. A Frontier Direction ([1] Yizhang Chen, Qisho Lin, Single Molecule Behavior and Intracellular Real-Time Detection in Life Sciences, 1, Beijing: Science Press, 2005, 1-11. [2] M.J.J.A.Dvorak, The application of atomic force microscopy to the study of living vertebral cells in culture, Methods, 2003(29): 86-96). [0003] With its un...

Claims

the structure of the environmentally friendly knitted fabric provided by the present invention; figure 2 Flow chart of the yarn wrapping machine for environmentally friendly knitted fabrics and storage devices; image 3 Is the parameter map of the yarn covering machine
Login to view more

Application Information

Patent Timeline
no application Login to view more
IPC IPC(8): G01Q60/24
Inventor 王宏达潘延刚徐海娇蔡明军单玉萍蒋俊光
Owner CHANGCHUN INST OF APPLIED CHEMISTRY - CHINESE ACAD OF SCI
Who we serve
  • R&D Engineer
  • R&D Manager
  • IP Professional
Why Eureka
  • Industry Leading Data Capabilities
  • Powerful AI technology
  • Patent DNA Extraction
Social media
Try Eureka
PatSnap group products