Parameter optimization method of photoelectric theodolite based on star matching

A photoelectric theodolite and optimization method technology, applied in theodolite, instrument, measuring device, etc., can solve the problems of low parameter accuracy, difficult registration of sensor detection time, large manual measurement error, etc.

Active Publication Date: 2016-08-17
INST OF OPTICS & ELECTRONICS - CHINESE ACAD OF SCI
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  • Summary
  • Abstract
  • Description
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Problems solved by technology

[0010] The technical problem solved by the present invention: aiming at the low accuracy of system parameters such as the encoder, equivalent, and bullseye of the photoelectric theodolite, the manual measurement error is relatively large, and the sensor detection has the problem of difficult registration in time, use star matching to perform system parameters Direct Solving and Optimization

Method used

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  • Parameter optimization method of photoelectric theodolite based on star matching
  • Parameter optimization method of photoelectric theodolite based on star matching
  • Parameter optimization method of photoelectric theodolite based on star matching

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Embodiment Construction

[0027] The following are specific implementation methods of the present invention. But following embodiment only limits to explain the present invention, and protection scope of the present invention should comprise the whole content of claim, and promptly can realize the whole content of claim of the present invention to those skilled in the art through following embodiment.

[0028] In the following specific examples, the purpose is to use an observation image containing multiple stars, such as image 3 (a) Calibrate the equivalence and system error of the theodolite, and solve the encoder value corresponding to the time of the image, so as to bypass the time registration problem of the encoder and improve the measurement accuracy of the system.

[0029] The first step of the present invention is to establish the measurement equation of the star and determine the required system parameters. Assume that the position of the center of mass of the star in the system observation...

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Abstract

The invention discloses a star-matching-based electro-optic theodolite parameter optimization method. The method aims at the problems that system parameters such as encoders, equivalents and bullseyes are low in precision, the manual measurement error is large and the sensor detection time is difficultly matched, the system parameters in a electro-optic theodolite are reversely solved by utilizing accurate match of relative observation positions and theoretical positions among stars, so that the high-precision optimization of the parameters under star matching is realized. The method has the beneficial effects that the system parameters can be fully automatically and quantitatively calibrated, the temporal registration and other problems can be avoided, and the measurement accuracy of the theodolite is greatly improved.

Description

technical field [0001] The invention belongs to the field of photoelectric measurement, and in particular relates to a method for solving and optimizing system parameters of a photoelectric theodolite. Background technique [0002] Due to the environmental parameters and the equipment itself, the pointing accuracy of the photoelectric theodolite often contains large errors. This pointing error is caused by many factors, such as: [0003] ●System error: the error between the measured value and the theoretical value caused by the environment and equipment, including atmospheric refraction, manufacturing and assembly errors of the telescope, gravitational deformation of the telescope, and deformation errors caused by temperature changes. The structural factors of the telescope include axis The error of the system, the deflection of the lens barrel, the deformation of the fork arm or the yoke, etc., the error can be considered to be unchanged in a short time in the same field o...

Claims

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Application Information

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Patent Type & Authority Patents(China)
IPC IPC(8): G01C25/00
CPCG01C1/02G01C25/00
Inventor 罗一涵张涯辉陈科
Owner INST OF OPTICS & ELECTRONICS - CHINESE ACAD OF SCI
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