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Mueller matrix self calibration measurement method

A measurement method and self-calibration technology, applied in the direction of polarization influence characteristics, etc., can solve problems such as limited measurement accuracy, complex calibration method demonstration and calibration process, and influence on Mueller matrix measurement accuracy

Inactive Publication Date: 2014-06-04
NAT ASTRONOMICAL OBSERVATORIES CHINESE ACAD OF SCI
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  • Application Information

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Problems solved by technology

In the former, the performance of the standard sample directly affects the measurement accuracy of the Mueller matrix; in the latter, the empty matrix calibration belongs to the first-order approximate solution, and the measurement accuracy is limited
Both calibration methods have flaws, and both require complex calibration method demonstration and calibration process

Method used

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Embodiment Construction

[0042] Embodiments of the present invention are described as follows in conjunction with accompanying drawings:

[0043] see figure 1 , the structure of the self-calibration measurement method of Mueller matrix in the present invention is composed of a light source 1, a polarization generator 2, a measured sample 3, a polarization analyzer 4, a detector 5 and a computer 6. The polarization generator comprises a rotating polarizer 7 and a rotating wave plate 8 (see figure 2 ). The polarization analyzer is made up of two ferroelectric liquid crystal wave plates 9,10 and a polarizer 11 (see image 3 ), the ferroelectric liquid crystals 9 and 10 change the orientation of the fast axis at a modulation angle of 45 degrees to obtain four independent outgoing polarization states. The light beam generated by the light source 1 enters the polarization generator 2, and the polarization generator 2 is controlled by the computer 6 to rotate the polarizer 7 and the wave plate 8 freely a...

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Abstract

The present invention relates to a Mueller matrix self calibration measurement method, the biggest characteristic of a Mueller matrix measurement method in the prior art is the need of precision calibration of an optical system of a measuring device, and the difficulty of precision measurement of a Mueller matrix is increased. According to the Mueller matrix self calibration measurement method, Stokes parameters of output polarization states before and after a to-be-test sample is put in are measured, a formula of the functional relationship between measured output light intensity and unknown parameters of a system and a Mueller matrix of a measured sample is established, and the Mueller matrix of the to-be-test sample is obtained by solution with a multiple-parameter nonlinear fitting method. The Mueller matrix self calibration measurement method needs no precision calibration of the measurement system, and realizes the self calibration measurement of the Mueller matrix, and the measurement method is simple and easy to operate, and can be widely used in Mueller matrix measurement of various polarization components and optical systems.

Description

technical field [0001] The invention belongs to the technical field of polarization optical detection, in particular to a self-calibration measurement method for Mueller matrix detection of polarization elements and optical systems. Background technique [0002] Mueller matrix measurement is one of the important means of polarization detection. The Mueller matrix contains all the polarization characteristics of the measured medium (except the total phase), and is widely used to determine the birefringence effect, loss or gain effect, etc. of media such as optical devices and optical systems. Polarization characteristic parameters such as depolarization effect. [0003] The basic device of the Mueller matrix measurement method is mainly composed of a polarization generator, a measured sample, and a polarization analyzer. The polarization generator and the polarization analyzer can be a combination of a polarizer and a wave plate, a combination of a photoelastic modulator, a ...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G01N21/21
Inventor 侯俊峰
Owner NAT ASTRONOMICAL OBSERVATORIES CHINESE ACAD OF SCI
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