Wide view field type infrared light three-dimensional morphology measurement method and device thereof

A technology of three-dimensional shape and infrared light, which is applied in the direction of measuring devices, optical devices, instruments, etc., can solve the problems of difficult measurement, difficult to obtain three-dimensional shape of occluded parts, and small measurement range, so as to reduce time complexity , extend the range, improve the effect of measurement accuracy

Inactive Publication Date: 2014-06-25
PEKING UNIV
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Problems solved by technology

Difficult to measure in infrared conditions as the color information of the fringe is used for encoding
In addition, the existing structured light ...

Method used

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  • Wide view field type infrared light three-dimensional morphology measurement method and device thereof
  • Wide view field type infrared light three-dimensional morphology measurement method and device thereof
  • Wide view field type infrared light three-dimensional morphology measurement method and device thereof

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Embodiment Construction

[0013] The present invention will be described in detail below in conjunction with the accompanying drawings and embodiments.

[0014] like figure 1 As shown, a single set of the device of the present invention includes a projection device 1 , an image acquisition device 2 , a reference plane 3 , a rotation plane 4 and a computer (not shown in the figure). The specific structure of projection device 1 is as follows: figure 2 shown. The image acquisition device 2 is an infrared camera for collecting static images or an infrared camera for collecting dynamic images; the reference plane 3 is a white plane arranged on the opposite side of the image acquisition device 2 . The measured object 5 is placed on the rotating plane 4 . And the angle between the rotation plane 4 and the reference plane 3 is equal to the angle between the axis of the projection device 1 and the connecting line between the optical center of the image acquisition device 2 and the optical center of the pro...

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Abstract

The invention relates to a large-scale infrared light three-dimensional morphology measurement method. The method comprises the following steps: 1) a 0.5 line/mm type grating is projected onto an object to be measured by an infrared projector; 2) projected images are acquired from three angles, calibrated images of projection apparatuses projected onto a reference plane at different view angles are recorded successively, and then measured images of each projection apparatus projected onto the surface of the object to be measured at the measurement time are recorded successively; 3) the partitioning algorithm is used in the calibrated images and the measured images to partition projection lines, and the centerline recognition algorithm is used to determine the centerline position of the projection lines; 4) the triangulation theory is used to obtain height difference data of corresponding points between the calibrated images and the measured images, that is the out-of-plane displacement curve of each projection line; 5) the rotation translation matrix between two adjacent shooting angles is calculated through the curve Euclidean distance and quaternion; 6) and the height difference data of each projection apparatus is merged into the final three-dimensional morphology data to obtain the three-dimensional morphology measurement result; in the projected image acquisition process, the projected images are acquired from three angles; wherein the constraint condition is that part of information between two adjacent acquisition angles is coincident for calculating the rotation translation matrix in the step 5).

Description

technical field [0001] The invention relates to a machine vision method and device, in particular to a method and device for three-dimensional shape measurement with infrared light of a wide field of view. Background technique [0002] Three-dimensional object surface profile measurement is an important means to obtain the morphological characteristics of objects. It is not only of great significance in military, industrial and other fields, but also has broad application prospects in civilian fields such as medicine, health, art and entertainment. Optical non-contact 3D shape measurement has the advantages of full field, fast, high resolution and rapid data extraction, so it is widely used. At present, the commonly used optical non-contact 3D shape measurement methods include laser triangulation projection method, Moiré projection method and structured light method, etc. Among them, the structured light method can measure data in a short period of time, thereby greatly imp...

Claims

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Application Information

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IPC IPC(8): G01B11/25
Inventor 王晔李彦张珏方竞
Owner PEKING UNIV
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