Multi-core processor soft error pressure test program generating system and method

Abstract

The invention belongs to the technical field of processors and particularly relates to a multi-core processor soft error pressure test program generating system and method. The system comprises a code generator, a multi-core processor simulator, an arbitrating module and a machine learning module. The code generator generates a multi-core processor system structure weakness factor limit test program according to control parameters. The multi-core processor simulator operates the limit test program to generate system structure weakness factor values. The arbitrating module judges whether the multi-core processor system structure weakness factor limit test program generated by the code generator accords to requirements or not. The machine learning module is used for operating a genetic algorithm tool to optimize the control parameters of the code generator. The system has the advantages that the generated AVF limit test program can detect the maximum value of soft error occurrence rate in one system structure to the maximum extent, and searching and modifying a benchmark test program are omitted.

Description

technical field [0001] The invention belongs to the technical field of processors, and in particular relates to a system and method for generating a multi-core processor soft error stress test program. Background technique [0002] Moore's Law states that when the price remains constant, the number of transistors that can be accommodated on an integrated circuit will double approximately every 18 months, and the performance will also double. However, the emergence of each new technology will bring new technical problems and hinder the promotion and application of emerging technologies. "Soft error" is a kind of "transient error" that occurs in the case of shrinking manufacturing process dimensions. This kind of error makes the development of the processor face serious challenges, making the processor fragile and more susceptible to environmental influences. [0003] This "momentary error" is caused by the flipping of a bit in a digital circuit, which is attributed to tiny ...

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Problems solved by technology

[0013] The present invention provides a multi-core processor soft error stress test program generation system and method, aiming to solve the existing soft error detection and recovery methods to detect the range value of the soft error occurrence rate of a certain architecture type processor , a technical problem requiring the use of a large number of different test programs and limited by the type of architecture

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