Screening method of high-quality morchella conica strains
The technology of a kind of peak Morchella and a screening method, which is applied in the field of screening high-quality strains of the peak Morchella, can solve problems such as unstable yield, and achieve the effects of solving unstable yield, close to individual growth speed, and fast mycelial growth speed.
- Summary
- Abstract
- Description
- Claims
- Application Information
AI Technical Summary
Problems solved by technology
Method used
Image
Examples
Embodiment Construction
[0021] Randomly collect 20 morel strains, and number them as M001, M002, M003...M020.
[0022] see figure 1 , individual strain length: the length L from the top outer edge of the bacterial strain cap to the bottom outer edge of the strain stipe is the individual strain length.
[0023] Cap length: the length LC from the top outer edge of the bacterial strain cap to the bottom outer edge of the bacterial strain cap is the cap length.
[0024] Step (1), four-level elimination screening of the individual size, external shape and color, and sporulation ability of the parents
[0025] ①Strain individual size screening
[0026] The collected morel strains free from diseases and insect pests are divided into three grades according to the individual size: 10 cm ≤ strain individual length L ≤ 15 cm is the first grade, 5 cm ≤ strain individual length L < 10 cm is the second grade, and the individual strain If the length L<5cm is classified as the third grade, the third grade will b...
PUM
Property | Measurement | Unit |
---|---|---|
Diameter | aaaaa | aaaaa |
Abstract
Description
Claims
Application Information
- R&D Engineer
- R&D Manager
- IP Professional
- Industry Leading Data Capabilities
- Powerful AI technology
- Patent DNA Extraction
Browse by: Latest US Patents, China's latest patents, Technical Efficacy Thesaurus, Application Domain, Technology Topic, Popular Technical Reports.
© 2024 PatSnap. All rights reserved.Legal|Privacy policy|Modern Slavery Act Transparency Statement|Sitemap|About US| Contact US: help@patsnap.com