Signal sampling circuit resistor-capacitor component short circuit and open circuit fault diagnosis method

Abstract

The invention discloses a signal sampling circuit resistor-capacitor component short circuit and open circuit fault diagnosis method. A DC transfer function of signal input end voltage and circuit output end voltage in the normal state of a circuit is established by the method; the short circuit and open circuit states of each component in the circuit are simulated so that DC transfer function equations of the circuit input end voltage and the circuit output end voltage under the states are obtained; concrete parameter values of each component are put into the corresponding DC transfer function equations so that a circuit fault diagnosis table is established; the signal input end voltage and the circuit output end voltage of the circuit are practically measured, and the corresponding possible fault point is searched according to the diagnosis table; and the component parameter value of the possible fault point is measured by adopting a node resistance mode, based on which short circuit or open circuit of the component of the possible fault point is judged and finally the fault point of the circuit is confirmed. Defects of conventional fault diagnosis are overcome, and the fault point of the circuit is rapidly and effectively diagnosed so that maintenance efficiency of electrical equipment is enhanced, and normal operation of the electrical equipment is guaranteed.

Description

technical field [0001] The invention relates to a method for diagnosing short-circuit and open-circuit faults of a resistance-capacitance element of a signal sampling circuit. Background technique [0002] With the application and development of electronic technology, various electronic control systems are becoming more and more complex, usually including signal sampling circuits, I / O control circuits, computing processing circuits, etc. During the production process of products, due to the existence of process / testing risks, Generally, the circuits that are more prone to failure are concentrated in the signal sampling circuit and I / O control circuit. The traditional diagnosis method for circuit failure is to use the method of following the vines, tracing back level by level until the part where the failure occurs is found, and then through Component voltage / resistance changes for final fault determination. This is not a big problem for simple circuits, but for complex circ...

AI Technical Summary

Problems solved by technology

Obviously, such fault diagnosis is time-consuming and laborious, which reduces the maintenance efficiency of electrical equipment and affects the normal operation of electrical equipment.

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