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Object detection device

A technology for detecting devices and objects, which is applied in the direction of measuring devices, optical devices, instruments, etc., can solve the problems of slow operation speed, labor and time consumption, and lifting of objects 2, so as to reduce external interference and errors, eliminate manual requirements, The effect of improving detection efficiency

Active Publication Date: 2014-09-24
CASETEK COMP (SUZHOU) CO LTD +1
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0005] However, the known object detection device 1 needs to use the spacer T every time it detects, and the thickness of the spacer T may also have errors, resulting in a decrease in detection accuracy.
In addition, when the spacer T is inserted, the object 2 may also be lifted, which may lead to misjudgment by the object detection device 1
Moreover, each inspection requires manual operation, and the operation speed is quite slow. When the objects to be inspected are different, their standard inspection depths are also different. These two factors lead to a large number of inspections, which consume manpower and time Huge, increase production cost

Method used

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Embodiment Construction

[0027] An object detection device according to a preferred embodiment of the present invention will be described below with reference to related drawings, wherein the same components will be described with the same component symbols.

[0028] Figure 2A is a schematic diagram of the appearance of an object detection device in a preferred embodiment of the present invention, Figure 2B for Figure 2A An exploded schematic of the object detection device shown. Please also refer to Figure 2A and Figure 2B As shown, the object detection device 3 is used to detect the object 4 having the concave portion 41 , more precisely, to detect whether the depth H3 of the concave portion 41 of the object 4 meets the standard.

[0029] Such as Figure 2A and Figure 2B As shown, in this embodiment, the object detection device 3 sequentially includes a base 31, a measurement module 32 and a platform 34 from bottom to top. In this embodiment, the measurement module 32 includes a connecti...

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PUM

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Abstract

The invention discloses an object detection device. The object detection device comprises a substrate, a platform, a drive component, a measuring module and at least one detection unit. The substrate comprises a plurality of supporting posts. The platform comprises an upper surface. The platform is parallel to the substrate and arranged on the supporting posts, and the platform is provided with an opening. The upper surface is used for loading an object, and the concave part of the object protrudes out of the upper surface. The drive component is arranged at the substrate. The measuring module is arranged at the drive component. The measuring module passes through the opening and protrudes out of the upper surface of the platform in a set height, and the measuring module is capable of moving along the detection direction relative to the substrate under the drive of the drive component. The detection unit is arranged at the upper surface. When detecting, the drive component drives the measuring module to move in the detection direction, if the detection unit discovers that the object moves along with the measuring module, the depth of the concave part of the object is smaller than or equal to the set height. The object detection device is capable of automatically detecting the object and avoiding the error and operation difficulty due to manual detection and enables the object to be detected effectively.

Description

technical field [0001] The present invention relates to an object detection device, in particular to an object detection device capable of improving detection efficiency. Background technique [0002] In recent years, with the development of high-tech industries, the requirements for precision have become higher and higher. The high precision of machine tools, various industrial machinery, and measuring instruments, coupled with ultra-precision processing machines, semiconductor process equipment, and electronic information equipment , Atomic force microscopes and other tools have reached the micro / nano level. Therefore, providing the dimensional accurate parts and components required by the above-mentioned mechanical equipment has become one of the main factors affecting product quality and operational efficiency. [0003] In order to meet the requirements of the size and precision of the parts and components of each machine and equipment, it has developed its own testing ...

Claims

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Application Information

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IPC IPC(8): G01B11/22
Inventor 吴曦晖赵力蓉
Owner CASETEK COMP (SUZHOU) CO LTD
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