Test resource rapid access method based on HIT-TENA

A HIT-TENA and access method technology, applied in the direction of program control devices, etc., can solve the problems of high difficulty in the access process, difficult to test the rapid organization and operation of the system, reduce writing and maintenance, realize reuse and composability, reduce workload effect

Inactive Publication Date: 2014-09-24
HARBIN INST OF TECH
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  • Summary
  • Abstract
  • Description
  • Claims
  • Application Information

AI Technical Summary

Problems solved by technology

[0006] The present invention proposes a HIT-TENA-based fast access method for test resources in order to solve the problem of high difficulty in entering the entire access process, difficulty in rapid organization and operation of the test system, and repetitive work in the access process.

Method used

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  • Test resource rapid access method based on HIT-TENA

Examples

Experimental program
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specific Embodiment approach 1

[0041] Specific implementation mode 1: A HIT-TENA-based fast access method for test resources in this implementation mode is specifically prepared according to the following steps:

[0042] Step A, select an access mode according to the type of access resource required: the access mode includes resource component template encapsulation, general protocol mode encapsulation, Simulink model mode encapsulation, control mode encapsulation and virtual model mode encapsulation;

[0043] Step B. Edit the basic information of the test resource, wherein the basic information specifically includes resource component type name, resource project name, resource icon, project save location, project compilation location, resource host name and host IP address;

[0044] Step C. Load the object model required for accessing resources, edit the ordering or publishing capabilities of test resources, select the type of object model, and fill in the corresponding entity name; the object model is used...

specific Embodiment approach 2

[0051] Specific implementation mode 2: The difference between this implementation mode and specific implementation mode 1 is that the specific steps of editing the ability to order or publish test resources in step C are as follows:

[0052] Step C1, load the object model file, the object model file is the data type in the HIT-TENA architecture, data interaction is performed through the object model, the loaded object model is the data type of the test resource access in the HIT-TENA architecture interaction;

[0053] Step C2, analyze the loaded object model, analyze the name of the object model and the names and data types of the attributes of each level of the object model through the file characteristics of the object model, the analysis process is as follows Figure 7 :

[0054] The object model file is described by XML language. By loading the object model file, the parser obtains the DOM root node name and data type of the data structure in all levels to form a target cl...

specific Embodiment approach 3

[0056] Embodiment 3: The difference between this embodiment and Embodiment 1 or 2 is that in step E, according to the protocol format required by the test resource, the protocol item is designed through the configuration interface, the communication mode is selected, and the input or output of the protocol is set. The specific process is:

[0057] Step E1, design according to the protocol that the test resource can receive and send, wherein the content of the design is:

[0058] Edit the basic features of the protocol. The basic features include: protocol type, protocol source device, protocol target device, protocol length position, protocol length data type and remarks, etc.; among them, the protocol type includes ordinary frames and dynamic frames, and ordinary frames represent the length of the protocol And the information content is fixed, and the dynamic frame indicates that the length of the protocol and the information content are dynamically changed; the dynamic frame...

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Abstract

The invention relates to a test resource rapid access method based on an HIT-TENA. The test resource rapid access method based on the HIT-TENA mainly solves the problems that the whole access process is difficult, a test system carries out operation difficultly, and repeated operation exists in the access process. The test resource rapid access method based on the HIT-TENA comprises the steps of 1, selecting an access mode; 2, editing basic information of test resources; 3, loading an object model required by access resources; 4, performing configuration according to the access mode; 5, generating test resource codes according to a protocol format; 6, performing modular package on a Simulink model; 7, packaging a resource assembly of a control interface; 8, packaging a virtue model; 9, compiling assembly codes, and the like. The test resource rapid access method based on the HIT-TENA is applied to the field of test resource rapid access of the HIT-TENA.

Description

technical field [0001] The invention relates to a method for quickly accessing test resources based on HIT-TENA. Background technique [0002] Architecture-based development has become part of general engineering practice. In response to the needs in the field of testing and training, the US Department of Defense developed the "Test and Training Enabling Architecture (TENA)" through the Foundation Program 2010 (FI2010) project to realize the interoperability, reuse and combination of range resources . [0003] The present invention proposes a test training system structure (HIT-TENA) on the basis of referring to the TENA system structure and combining the current domestic test and training field construction status. Figure 9 It is an overview map of HIT-TENA, integrates various test and training resources in the shooting range, and quickly builds a test training system. [0004] In the test training system structure, there are often many kinds of resource equipment involv...

Claims

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Application Information

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Patent Type & Authority Applications(China)
IPC IPC(8): G06F9/44
Inventor 孙超柳中华陈寅生薄中魏长安杨京礼姜守达
Owner HARBIN INST OF TECH
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