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Flat field correction method of ultraviolet CCD pattern

A flat-field correction and pattern technology, applied in image data processing, instrumentation, calculation, etc., can solve the problem of inability to correct the structural pattern of broadband observation images, and achieve the effect of improving photometric accuracy and processing accuracy.

Inactive Publication Date: 2014-11-26
NAT ASTRONOMICAL OBSERVATORIES CHINESE ACAD OF SCI
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Problems solved by technology

Solved the problem that narrow-band flat-field light sources (such as LED lights) cannot correct structural patterns in wide-band observation images (playing a key role in the flat-field processing of my country's moon-based ultraviolet astronomical telescope observations)

Method used

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  • Flat field correction method of ultraviolet CCD pattern
  • Flat field correction method of ultraviolet CCD pattern
  • Flat field correction method of ultraviolet CCD pattern

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Embodiment

[0044] The application example of this implementation is the correction of structural patterns in the images observed by the moon-based ultraviolet astronomical telescope. image 3 Shown in the middle box are examples of structural patterns in the observed image. The characteristic parameters of the instrument are: the spectral width of the observation light source: 245--350 nanometers, the spectral width of the LED flat-field lamp: 279--297 nanometers, and the typical peak-to-peak fluctuation of the pattern is 10%-15%. According to an embodiment of the present invention, the steps performed are as follows:

[0045] (1) Use the LED light flat-field device of the telescope to obtain 6 narrow-band LED light flat-field images.

[0046] (2) According to the embodiments of the present invention, the narrow-band flat-field image is carried out to reduce the background (10 background images) and the basic processing of merging images; obtain the LED flat-field image after the basic ...

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Abstract

A flat field correction method of an ultraviolet CCD pattern includes the steps that (1) at least five to ten narrow-band flat field images are acquired; (2) the acquired narrow-band flat field images are processed to remove background signals in the images, and the images are combined into one flat field image; (3) components in the flat field image are separated, and the large-scale components and the small-scale components of the flat field image are separated; (4) according to the determined large-scale components and small-scale components, correction flat field images with different ratios R are synthesized; (5) any real observation image is calibrated through the correction flat field images, and the optimum correction flat field image and the corresponding ratio R are determined according to the observation image signal obtained after calibration; (6) flat field calibration is performed on the observation image of an ultraviolet CCD camera through the determined optimum correction flat field image, and correction of the pattern of the ultraviolet CCD camera is completed.

Description

technical field [0001] The invention relates to a flat-field correction method of an ultraviolet CCD pattern, which is applied to the calibration processing of an ultraviolet band CCD photometric astronomical observation image: flat-field correction of a CCD pattern. Background technique [0002] CCD (Charge Coupled Device: Charge Coupled Device image sensor) camera is the most popular terminal device in modern astronomical observation. In the process of modern astronomical observation data processing, the processing of flat field is the basis for calibrating the data observed by CCD camera. One of the processing steps. Its main physical mechanism is: CCD is a surface array composed of many photosensitive pixels arranged according to certain rules. Each pixel in the area array is a MOS capacitor (mostly a photosensitive diode). When a beam of light is projected onto the MOS capacitor, the photons pass through the transparent electrode and oxide layer and enter the MOS capac...

Claims

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Application Information

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IPC IPC(8): G06T7/00G06T5/50
Inventor 吴潮魏建彦曹莉裘予雷
Owner NAT ASTRONOMICAL OBSERVATORIES CHINESE ACAD OF SCI
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